APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020;
Denver, Colorado
Session Index
Session J10: Advances in Scanned Probe Microscopy 4: Machine Learning for Correlative and Analytical Measurements in Scanning Probe Microscopy
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Sponsoring Units: GIMS
Chair: Neus Domingo, Institut Català de Nanociència i Nanotecnologia
Room: 108
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J10.00001: Surface Structure of α-Quartz(0001)
Kristen Burson, Georg H. Simon, Clare M. Munroe, Markus Heyde, H J Freund
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J10.00002: Nonlinearity-induced frequency mixing in AFM: novel contrast imaging with machine learning
Greg Haugstad, Andrew Avery, Stephan Hubig, Rachel Rahn, Alon McCormick, Bing Luo, Han Seung Lee
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J10.00003: Light Scattering and Localization by Dislocation Scattering Sites
Farbod Shafiei, Tommaso Orzali, Alexey Vert, Mohammad-Ali Miri, PY Hung, Man Hoi Wong, Andrea Alu, Gennadi Bersuker, Michael C Downer
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J10.00004: Native and induced surface charge-transfer doping of MoTe2
Gheorghe Stan, Cristian Ciobanu, Sri Ranga Jai Likith, Asha Rani, Siyuan Zhang, Christina Hacker, Sergiy Krylyuk, Albert Davydov
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J10.00005: A traveling salesperson and sparse sampling boost to quasiparticle interference mapping
Jens Oppliger, Fabian Natterer
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J10.00006: Controlled Manipulation of Molecules: A New Pathway to Catalysis Research
Omur Dagdeviren, Chao Zhou, Milica Todorovic, Eric Altman, Udo Dietmar Schwarz
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J10.00007: Optimal Bayesian experimental design for everyday measurements
Robert McMichael, Sergey Dushenko, Kapildeb Ambal
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J10.00008: Defect Identification and Statistics Toolbox (DIST): A Tool for Automating Defect Analysis and Statistics Generation
Alana Gudinas, Shawna Hollen, Jason P Moscatello
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J10.00009: Learning hidden structure of nanoscale spectroscopies with metric analysis
Invited Speaker:
Petro Maksymovych
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