Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session J10: Advances in Scanned Probe Microscopy 4: Machine Learning for Correlative and Analytical Measurements in Scanning Probe Microscopy
2:30 PM–4:42 PM,
Tuesday, March 3, 2020
Room: 108
Sponsoring
Unit:
GIMS
Chair: Neus Domingo, Institut Català de Nanociència i Nanotecnologia
Abstract: J10.00002 : Nonlinearity-induced frequency mixing in AFM: novel contrast imaging with machine learning*
View Presentation
Abstract
Presenter:
Greg Haugstad
(Characterization Facility, University of Minnesota)
Authors:
Greg Haugstad
(Characterization Facility, University of Minnesota)
Andrew Avery
(Unilever Research)
Stephan Hubig
(Ecolab)
Rachel Rahn
(Ecolab)
Alon McCormick
(Dept. of Chem. Eng. and Mat. Sci., University of Minnesota)
Bing Luo
(Characterization Facility, University of Minnesota)
Han Seung Lee
(Characterization Facility, University of Minnesota)
Collaboration:
Greg Haugstad
1Intermodulation Products AB, Stockholm.
*Equipment and effort funded by the Industrial Partnership for Research in Interfacial and Materials Engineering and the College of Science and Engineering, Univ. of Minnesota.
Follow Us |
Engage
Become an APS Member |
My APS
Renew Membership |
Information for |
About APSThe American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics. |
© 2023 American Physical Society
| All rights reserved | Terms of Use
| Contact Us
Headquarters
1 Physics Ellipse, College Park, MD 20740-3844
(301) 209-3200
Editorial Office
1 Research Road, Ridge, NY 11961-2701
(631) 591-4000
Office of Public Affairs
529 14th St NW, Suite 1050, Washington, D.C. 20045-2001
(202) 662-8700