Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session J10: Advances in Scanned Probe Microscopy 4: Machine Learning for Correlative and Analytical Measurements in Scanning Probe Microscopy
2:30 PM–4:42 PM,
Tuesday, March 3, 2020
Room: 108
Sponsoring
Unit:
GIMS
Chair: Neus Domingo, Institut Català de Nanociència i Nanotecnologia
Abstract: J10.00005 : A traveling salesperson and sparse sampling boost to quasiparticle interference mapping*
Presenter:
Fabian Natterer
(Department of Physics, University of Zurich)
Authors:
Jens Oppliger
(Department of Physics, University of Zurich)
Fabian Natterer
(Department of Physics, University of Zurich)
[1] J. Oppliger and F.D. Natterer, arXiv 1908.01903
*Funding from the Swiss National Science Foundation under project number PP00P2_176866 is appreciated.
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