Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session J10: Advances in Scanned Probe Microscopy 4: Machine Learning for Correlative and Analytical Measurements in Scanning Probe Microscopy
2:30 PM–4:42 PM,
Tuesday, March 3, 2020
Room: 108
Sponsoring
Unit:
GIMS
Chair: Neus Domingo, Institut Català de Nanociència i Nanotecnologia
Abstract: J10.00007 : Optimal Bayesian experimental design for everyday measurements*
Presenter:
Robert McMichael
(National Institute of Standards and Technology)
Authors:
Robert McMichael
(National Institute of Standards and Technology)
Sergey Dushenko
(University of Maryland and National Institute of Standards and Technology)
Kapildeb Ambal
(University of Maryland and National Institute of Standards and Technology)
*S.D. and K.A. acknowledge support under the Cooperative Research Agreement between the University of Maryland and the National Institute of Standards and Technology, Award 70NANB14H209, through the University of Maryland.
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