Bulletin of the American Physical Society

APS March Meeting 2020

Volume 65, Number 1

Monday–Friday, March 2–6, 2020; Denver, Colorado

Session Index

Session B10: Advances in Scanned Probe Microscopy 2: High Frequencies and Optical Techniques

Focus Session

Show Abstracts

Sponsoring Units: GIMS
Chair: Christopher Lutz, IBM Research – Almaden
Room: 108

		B10.00001: Measurement of fluorescent quantum yield using photothermal deflection spectroscopy Stephen Johnson, Brandon T Couch, Andrew Meyer, Brandon Heller
		B10.00002: Imaging chiral optical excitations through inelastic electron-light scattering Tyler Harvey, Jan-Wilke Henke, Ofer Kfir, Claus Ropers
		B10.00003: Visualization of Surface Acoustic Wave by Transmission Mode Microwave Impedance Microscopy Lu Zheng, Linbo Shao, Qicheng Zhang, Alan T Johnson, Marko Loncar, Keji Lai
		B10.00004: Experimental and numerical studies of near-field infrared phenomena at nanometer length scales P. McArdle, D. Lahneman, H. Jiang, M. M. Qazilbash, T. Slusar, H.-T. Kim, A. Biswas, F. Keilmann, J. Chen
		B10.00005: Time-Resolved Scanning Probe Techniques – Inspecting the Dynamical Properties of Nanoscale Solids in Real Space and Real Time Invited Speaker: Lukas Eng

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Bulletin of the American Physical Society

APS March Meeting 2020

Volume 65, Number 1

Monday–Friday, March 2–6, 2020; Denver, Colorado

Session Index

Session B10: Advances in Scanned Probe Microscopy 2: High Frequencies and Optical Techniques

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