Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session B10: Advances in Scanned Probe Microscopy 2: High Frequencies and Optical Techniques
11:15 AM–12:39 PM,
Monday, March 2, 2020
Room: 108
Sponsoring
Unit:
GIMS
Chair: Christopher Lutz, IBM Research – Almaden
Abstract: B10.00004 : Experimental and numerical studies of near-field infrared phenomena at nanometer length scales*
Presenter:
P. McArdle
(Department of Physics, College of William and Mary)
Authors:
P. McArdle
(Department of Physics, College of William and Mary)
D. Lahneman
(Department of Physics, College of William and Mary)
H. Jiang
(Department of Physics, College of William and Mary)
M. M. Qazilbash
(Department of Physics, College of William and Mary)
T. Slusar
(Metal-Insulator Transition Laboratory,Electronics and Telecommunications Research Institute)
H.-T. Kim
(Metal-Insulator Transition Laboratory,Electronics and Telecommunications Research Institute)
A. Biswas
(Department of Physics, University of Florida)
F. Keilmann
(Fakultät für Physik & Center for NanoScience (CeNS), Ludwig-Maximilians-Universität)
J. Chen
(Department of Chemistry and Biochemistry, University of Arkansas)
*M.M.Q. acknowledges support from ETRI and the National Science Foundation (NSF). Simulation work was performed, in part, using computing facilities at the College of William and Mary.
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