Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session B10: Advances in Scanned Probe Microscopy 2: High Frequencies and Optical Techniques
11:15 AM–12:39 PM,
Monday, March 2, 2020
Room: 108
Sponsoring
Unit:
GIMS
Chair: Christopher Lutz, IBM Research – Almaden
Abstract: B10.00002 : Imaging chiral optical excitations through inelastic electron-light scattering*
Presenter:
Tyler Harvey
(IV. Physicalisches Institut, University of Göttingen)
Authors:
Tyler Harvey
(IV. Physicalisches Institut, University of Göttingen)
Jan-Wilke Henke
(IV. Physicalisches Institut, University of Göttingen)
Ofer Kfir
(IV. Physicalisches Institut, University of Göttingen)
Claus Ropers
(IV. Physicalisches Institut, University of Göttingen)
Electrons can exchange integer multiples of the photon energy with an optical field near a material [1,2]. The strength of the coupling between electron momentum states and photon number in the optical field depends on material structure and optical properties. Because sub-nanometer spotsize is routine in electron microscopes, this interaction can be employed to image optical fields with nanometer spatial resolution. By illuminating with left- and right-circularly polarized light and measuring the difference in coupling strength with electrons, we probe chiral optical near fields. This technique may enable the investigation of chiral optical and electronic states in plasmonic nanostructures, molecules and atoms with sub-nanometer spatial resolution.
[1] B. Barwick et al., Nature 462 (2009) 902.
[2] A. Feist et al., Nature 521 (2015) 200.
*T.R.H. acknowledges support from the Alexander von Humboldt Foundation. The work is also supported by the German Science Foundation (DFG-SFB 1073/project A05).
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