Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session G63: Defects in Gallium Oxide and Nitride
11:15 AM–2:15 PM,
Tuesday, March 3, 2020
Room: Mile High Ballroom 4D
Sponsoring
Units:
DMP DCMP FIAP
Chair: Anderson Janotti, University of Delaware
Abstract: G63.00012 : Influence of interfacial defects on the electronic states at GaN p-i-n diode interfaces*
Presenter:
GuanJie Cheng
(Department of Materials Science and Engineering, University of Michigan)
Authors:
GuanJie Cheng
(Department of Materials Science and Engineering, University of Michigan)
Jiaheng He
(Department of Materials Science and Engineering, University of Michigan)
Alexandra Zimmerman
(Department of Materials Science and Engineering, University of Michigan)
Davide Del Gaudio
(Department of Materials Science and Engineering, University of Michigan)
Fabian Naab
(Michigan Ion Beam Laboratory, University of Michigan)
Mohsen Nami
(Department of Electrical Engineering, Yale University)
Bingjun Li
(Department of Electrical Engineering, Yale University)
Jung Han
(Department of Electrical Engineering, Yale University)
Rachel Goldman
(Department of Materials Science and Engineering, University of Michigan)
*ARPA-E AWD0000191
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