Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session G63: Defects in Gallium Oxide and Nitride
11:15 AM–2:15 PM,
Tuesday, March 3, 2020
Room: Mile High Ballroom 4D
Sponsoring
Units:
DMP DCMP FIAP
Chair: Anderson Janotti, University of Delaware
Abstract: G63.00011 : X-ray diffraction studies of GaN p-i-n structures for high power electronics*
Presenter:
Alexandra Zimmerman
(Materials Science and Engineering, University of Michigan)
Authors:
Alexandra Zimmerman
(Materials Science and Engineering, University of Michigan)
Jiaheng He
(Materials Science and Engineering, University of Michigan)
GuanJie Cheng
(Materials Science and Engineering, University of Michigan)
Davide Del Gaudio
(Materials Science and Engineering, University of Michigan)
Jordan Occena
(Materials Science and Engineering, University of Michigan)
Fabian Naab
(Michigan Ion Beam Laboratory, University of Michigan)
Mohsen Nami
(Department of Electrical Engineering, Yale University)
Bingjun Li
(Department of Electrical Engineering, Yale University)
Jung Han
(Department of Electrical Engineering, Yale University)
Rachel Goldman
(Materials Science and Engineering, University of Michigan)
*We gratefully acknowledge the support of ARPA-E through AWD0000191.
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