Monday, March 21, 2005
8:00AM - 8:36AM
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A18.00001: Interface Sensitive Measurement of High k - silicon dioxide – silicon system using Optical Second Harmonic Generation
Invited Speaker:
Alain Diebold
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Monday, March 21, 2005
8:36AM - 8:48AM
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A18.00002: Measurement of the Full State of Stress of Silicon with Micro-Raman Spectroscopy
Stephen Harris
, Ann O'Neill
, Wen Yang
, Peter Gustafson
, James Boileau
, W.H. Weber
, Bhaskar Majumdar
, Somnath Ghosh
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Monday, March 21, 2005
8:48AM - 9:00AM
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A18.00003: UV-Raman deformation coefficients in Si and SiGe alloys
Michael Canonico
, Ran Liu
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Monday, March 21, 2005
9:00AM - 9:12AM
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A18.00004: In-situ photovoltage shift measurements of hafnium oxides and silicates grown on Si(100) using femtosecond photoelectron spectroscopy
Daeyoung Lim
, Richard Haight
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Monday, March 21, 2005
9:12AM - 9:24AM
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A18.00005: An infrared probe of tunable dielectrics in metal-oxide-semiconductor structures
Kevin Mikolaitis
, Zhiqiang Li
, Guangming Wang
, Alan Heeger
, Dimitri Basov
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Monday, March 21, 2005
9:24AM - 9:36AM
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A18.00006: High Resolution 2D Dopant Profiling of FinFET Structures using Scanning Probe Microscopy
Alexander Khajetoorians
, Jianlong Li
, Li Shi
, Xiang-Dong Wang
, Chih-Kang Shih
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Monday, March 21, 2005
9:36AM - 9:48AM
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A18.00007: High-Resolution Microcalorimeters for X-ray Microanalysis
B.L. Zink
, G.C. Hilton
, J.N. Ullom
, K.D. Irwin
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Monday, March 21, 2005
9:48AM - 10:00AM
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A18.00008: High-resolution characterization of advanced interconnect and packaging architectures
Shriram Ramanathan
, Evan Pickett
, Patrick Morrow
, Yongmei Liu
, Rajen Dias
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Monday, March 21, 2005
10:00AM - 10:12AM
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A18.00009: Direct Imaging of Minority Carrier Drift in Luminescent Materials
David Luber
, Nancy Haegel
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Monday, March 21, 2005
10:12AM - 10:24AM
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A18.00010: Contact-free approach for the determination of minority carrier diffusion length
F.M. Bradley
, Will Freeman
, Nancy M. Haegel
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Monday, March 21, 2005
10:24AM - 10:36AM
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A18.00011: Structural and morphological characterization of GaN(0001) layers grown on SiC by maskless pendeo-epitaxy via X-ray Microdiffraction
R.I. Barabash
, G.E. Ice
, S. Einfeldt
, D. Hommel
, A.M. Roskovski
, R.F. Davis
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Monday, March 21, 2005
10:36AM - 10:48AM
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A18.00012: UHV Nanoworkbench and the `Roaming' Field Effect Transistor
Olivier Guise
, John T. Yates, Jr.
, Joachim Ahner
, Jeremy Levy
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Monday, March 21, 2005
10:48AM - 11:00AM
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A18.00013: An investigation of dopping profile for a one dimensional heterostructure
ZhaoHui Huang
, Dragan Stojkovic
, Paul Lammert
, Vincent Crespi
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