Bulletin of the American Physical Society
2005 APS March Meeting
Monday–Friday, March 21–25, 2005; Los Angeles, CA
Session A18: Focus Session: Semiconductor Characterization
8:00 AM–11:00 AM,
Monday, March 21, 2005
LACC
Room: 406A
Sponsoring
Units:
FIAP GIMS
Chair: David Seiler, NIST
Abstract ID: BAPS.2005.MAR.A18.2
Abstract: A18.00002 : Measurement of the Full State of Stress of Silicon with Micro-Raman Spectroscopy
8:36 AM–8:48 AM
Preview Abstract Abstract
Authors:
Stephen Harris
Ann O'Neill
Wen Yang
Peter Gustafson
James Boileau
(Ford Research and Advanced Engineering)
W.H. Weber
(University of Michigan)
Bhaskar Majumdar
(New Mexico Tech)
Somnath Ghosh
(Ohio State University)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2005.MAR.A18.2
Follow Us |
Engage
Become an APS Member |
My APS
Renew Membership |
Information for |
About APSThe American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics. |
© 2024 American Physical Society
| All rights reserved | Terms of Use
| Contact Us
Headquarters
1 Physics Ellipse, College Park, MD 20740-3844
(301) 209-3200
Editorial Office
100 Motor Pkwy, Suite 110, Hauppauge, NY 11788
(631) 591-4000
Office of Public Affairs
529 14th St NW, Suite 1050, Washington, D.C. 20045-2001
(202) 662-8700