Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session S64: Controlling Dielectrics and Ferroics for DevicesFocus
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Sponsoring Units: DMP DCOMP Chair: Ryan Need, National Institute of Standards and Technology Room: Mile High Ballroom 4E |
Thursday, March 5, 2020 11:15AM - 11:27AM |
S64.00001: Low-Voltage Control of Magnetism in Fe0.49Rh0.51/0.68PbMg1/3Nb2/3O3-0.32PbTiO3 Thin Films Heterostructures Wenbo Zhao, Lei Zhang, Jieun Kim, David Pesquera, Gabriel Velarde, Lane Wyatt Martin With the rapid development of computing applications, researchers are motivated to develop novel low-energy consumption devices for information processing. Amongst candidate technology for such devices are low-power spin logics. Therein, magnetoelectric heterostructures remain a promising route to address the rising need of processing power. Previous research, however, has mainly utilized piezo-strains from piezoelectric bulk or thick films which require high voltages and energies due to their size.[1] Here, using 100 nm-thick 0.68PbMg1/3Nb2/3O3-0.32PbTiO3 thin-films as actuator layers, we discuss the potential for ultra-low-voltage control of magnetism in Fe0.49Rh0.51 thin-films via strain. Leveraging routes for epitaxial integration of metallic ferromagnets on oxide thin films, initial studies have demonstrated reversible changes in anomalous Hall resistivity with small voltages applied to the 0.68PbMg1/3Nb2/3O3-0.32PbTiO3 at room temperature which are attributed to the strain induced ferromagnetic and antiferromagnetic phase transition in Fe0.49Rh0.51. Our findings reveal the feasibility of voltage control of magnetism with piezoelectric thin-films and can be used in low-voltage/energy computing. |
Thursday, March 5, 2020 11:27AM - 11:39AM |
S64.00002: Electric-field Controllable Non-Volatile Ferroelastic Strain Response in Ferroelectrics with Thin Film Strain Engineering Wenhui Hou, Tara Pena, Carla Watson, Ahmad Azizimanesh, Stephen M Wu Recently, a type of ‘straintronic’ device combining thin film stress of capping layers, and ferroelastic coupling in relaxor ferroelectric Pb(Mg1/3Nb2/3)0.71Ti0.29O3 (PMN-PT), has been shown as an effective approach to electrically control strain/electronic phase of 2D MoTe2 [1]. An evolution from bipolar to non-volatile unipolar strain has been observed in devices under electric-field and temperature cycling, which is different from the typical strain response of PMN-PT alone. Here, we investigate the strain evolution of metal thin films deposited on (110) oriented PMN-PT surface under electric-field and temperature cycling and find that in the [-110] direction, it is strongly dependent on thin film stress. Tensile or compressively stressed films result in opposite ferroelastic unipolar responses under applied electric field, attributed to opposite electric-field biasing from elastic dipole locking in PMN-PT. Temperature cycling modifies thin film stress, which can be used to control the polarity of the unipolar strain response. Our finding expands the potential of the ‘straintronic’ platform where non-volatile strain can be controlled, and NMOS/PMOS style device polarity can be created through thin film strain engineering. |
Thursday, March 5, 2020 11:39AM - 11:51AM |
S64.00003: Low-voltage Graphene/LiNbO3 memristors Pradeep Chaudhary, Haidong Lu, Alexey Lipatov, Zahra Ahmadi, James PV McConville, Andrei Sokolov, Jeffrey Shield, Alexander Sinitskii, Marty Gregg, Alexei Gruverman Recent observations of domain wall conductivity in the LiNbO3 thin films may facilitate the development of electrically-tunable resistive switching devices employing conductive domain walls as functional elements. In LiNbO3 capacitors, several orders of magnitude modulation of resistance can be achieved by systematically changing the density of injected domain walls using voltage pulse amplitude above the coercive bias. However, a deleterious characteristic of this approach is a high-energy cost of polarization reversal due to high leakage current. Here, we demonstrate a new approach for tuning the device resistance by modulating the conductivity of domain walls rather than changing the domain configuration. Using the LiNbO3 thin film capacitors with graphene top electrodes, we show that once the device is set to a specific poly-domain state, its resistance can be continuously tuned by application of sub-coercive voltage. The tuning mechanism is based on reversible transition between the conducting and insulating states of the domain walls due to the electrically-induced wall bending near the sample surface. The developed approach provides an energy-efficient way to realize resistive functionality without the need of the domain structure modification by high voltage pulses. |
Thursday, March 5, 2020 11:51AM - 12:27PM |
S64.00004: An ultralow power magnetoelectric nonvolatile memory Invited Speaker: Yen-Lin Huang
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Thursday, March 5, 2020 12:27PM - 12:39PM |
S64.00005: Magnetocapacitance Effect and Magnetoelectric Coupling in Type-II Multiferroics RFeWO6 (R=Ho, Dy and Tb) Moein Adnani Takantapeh, Melissa Gooch, Narayan Poudel, Hung-Cheng Wu, Liangzi Deng, Zheng Wu, Chung-Kai Chang, Taha Salavati-fard, Yen-Chung Lai, Hung-Duen Yang, Lars C. Grabow, Paul C. W. Chu In this work, we investigated the multiferroic property and magnetoelectric (ME) coupling in HoFeWO6 with a noncentrosymmetric polar structure (space group Pna21). Low temperature XRD measurements down to 8 K did not show a structural phase transition and our DFT calculations reveal a stable structure. With an antiferromagnetic transition at TN=17.8 K and a ferroelectric transition with the onset at the same temperature, this compound is a type-II multiferroic which shows magnetoelectric (ME) coupling. Field-dependent dielectric measurements show magnetocapacitance (MC) effect with double hysteresis loop at low temperature, which is directly related to its metamagnetic behavior. We further studied the MC effect in other members of this family, in particular, DyFeWO6 and TbFeWO6 and compared the results with HoFeWO6. The observed MC effect and its direct correspondence with magnetization further confirm the ME coupling in these compounds. |
Thursday, March 5, 2020 12:39PM - 12:51PM |
S64.00006: Negative capacitance in the hexagonal-YbFeO3 epitaxial thin films Yu Yun, Xiaoshan Xu
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Thursday, March 5, 2020 12:51PM - 1:03PM |
S64.00007: Stability of the magnetoelectric state in Y-type hexaferrite single crystals Vilmos Kocsis, Taro Nakajima, Masaaki Matsuda, Akiko Kikkawa, Yoshio Kaneko, Junya Takashima, Kazuhisa Kakurai, Taka-hisa Arima, Yusuke Tokunaga, Yoshinori Tokura, Yasujiro Taguchi The magnetoelectric (ME) properties of the trigonal Y-type hexaferrites, Ba2-ySryCo2Fe12-xAlxO22, are related to the multiferroic FE3 phase [1,2]. Although this phase has been observed both as a metastable and as a stable phase [3,4,5], stable control over magnetization by electric field has not yet been achieved close to room temperature. This indicates that for applications, the stability of the multiferroic phase as well as the ME state are crucial issues, which are hard to investigate using conventional approaches. |
Thursday, March 5, 2020 1:03PM - 1:15PM |
S64.00008: Local probing of jerky switching dynamics in Pb(Zr0.2Ti0.8)O3 thin films Philippe Tuckmantel, Iaroslav Gaponenko, Stefano Gariglio, Joshua Agar, Lane Wyatt Martin, Patrycja Paruch Polarisation switching in ferroelectric materials is governed by the same competition between elasticity and disorder, which describes many systems from earthquake statistics to magnetic domain walls. The movement of the interface follows nonlinear creep and (de)pinning dynamics, with jerky individual events whose energy and size distributions are characterised by universal power laws. In ferroelectrics, domain nucleation and growth can be observed from nano to macroscale, providing a useful system in which this complex fundamental behaviour can be explored. |
Thursday, March 5, 2020 1:15PM - 1:27PM |
S64.00009: 2D Semiconductor Transistors using Layered van der Waals Oxide MoO3 as High-K Gate Dielectric Brian Holler, Kyle Crowley, Halyna Volkova, Marie-Helene Berger, Xuan Gao The search for smaller field effect transistors is leading research towards atomically thin 2D semiconductor materials. Due to the decreasing size of these transistors, there must be an emphasis on finding compatible gate dielectrics that can be equally effective in the 2D regime. MoO3 is an attractive multi-functional transition metal oxide replacement for gate dielectrics in field effect transistors due to its exfoliatable van der Waals structure in addition to its high dielectric constant. This study demonstrates that as-grown MoO3 has a high dielectric constant, K, of approximately 35 at room temperature at low frequencies by fabricating parallel plate capacitors from these thin flakes. Mechanically exfoliated MoO3 flakes are used to create 2D heterostructures with WSe2, demonstrating that MoO3 also induces holes in the WSe2 layer. Most importantly, MoO3 proves to be a strong gate dielectric when used as a top-gate material for WSe2 heterostructure devices. |
Thursday, March 5, 2020 1:27PM - 1:39PM |
S64.00010: First-principles investigations of ferroelectric and pyroelectric properties of HfO2 Shi Liu, Jian Liu, Brendan Hanrahan The presence of ferroelectricity in HfO2-based thin films have revitalized the interests in using ferroelectrics at the nanoscale. To understand the origin of ferroelectricity in this silicon-compatible ferroelectric, we investigated the kinetic effects of phase transitions in HfO2 thin films by quantifying the transition barriers between different polymorphs of hafnia with density-functional-theory calculations and variable-cell nudged elastic band technique. We found that the transition from the tetragonal phase to the polar orthorhombic phase is a fast process kinetically under clamping. We further explored the pryoelectricity in HfO2 with both first-principles lattice dynamics and ab initio molecular dynamics calculations. Unlike most conventional pyroelectrics, the large pyroelectricity of HfO2 results from the secondary effect which is intimately related to the negative longitudinal piezoelectric effect. |
Thursday, March 5, 2020 1:39PM - 1:51PM |
S64.00011: Ferroelectricity in [111]-oriented epitaxially strained HfO2 from fist principles Sebastian Reyes-Lillo First principles calculations are used to investigate the effect of (111) epitaxial strain in the structural and ferroelectric properties of Hafnia (HfO2), a silicon compatible high-k dielectric that is already used in high volume semiconductor manufacturing applications. We find that [111]-oriented epitaxial strain lowers the symmetry of the bulk cubic Fm-3m and tetragonal P42/nmc phases of HfO2 to rhombohedral R-3m and monoclinic P21/m, respectively. The polar orthorhombic Pca21 phase stabilizes a ferroelectric monoclinic P1 structure above -2% (111)-strain, not present in either bulk or (001)-strained form. Under (111)-strain, ferroelectricity displays an out of plane polarization component P~ 35μC/cm2. At large compressive strain (>2%), [111]-oriented thin films are paraelectric. We further explore the energy landscape of (111) strained HfO2 and possible pathways for the stabilization of ferroelectricity. |
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