Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session S33: Semiconductors and Applications II
11:15 AM–2:15 PM,
Thursday, March 7, 2019
BCEC
Room: 204B
Sponsoring
Unit:
FIAP
Chair: Thomas Vandervelde, Univ of Virginia
Abstract: S33.00007 : Analysis of the Critical Point Parameters of E0 and E0+Δ0 of Bulk Ge
12:27 PM–12:39 PM
Presenter:
Carola Emminger
(New Mexico State University)
Authors:
Carola Emminger
(New Mexico State University)
Nuwanjula S Samarasingha Arachchige
(New Mexico State University)
Farzin Abadizaman
(New Mexico State University)
Stefan Zollner
(New Mexico State University)
The dielectric function of Ge has been measured between 0.5 eV and 1.3 eV using spectroscopic ellipsometry at various temperatures between 10 K and 740 K. The interband CPs E0 and E0+Δ0, where E0 is the direct band gap of Ge and Δ0 is the spin-orbit splitting occurring at the center of the Brillouin zone, lie in this energy range and are subject of our investigations. Applying an analysis in reciprocal space by performing a discrete Fourier transform of the data points and fitting the resulting Fourier coefficients, the parameters describing the line shape of E0 are found as a function of temperature. Like for the CPs at higher energies, the authors find a red shift of the E0 and E0+Δ0 energies which can be described by a Bose-Einstein factor taking into account electron-phonon interactions. The results of the reciprocal-space analysis are compared to the parameters determined by a parametric semiconductor fit.
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