Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session R33: Superconducting Circuits: Design and Packaging
8:00 AM–11:00 AM,
Thursday, March 8, 2018
LACC
Room: 408B
Sponsoring
Unit:
DQI
Chair: Matteo Mariantoni, University of Waterloo
Abstract ID: BAPS.2018.MAR.R33.7
Abstract: R33.00007 : Fabrication of Sn-filled superconducting through-silicon vias (SC-TSV) for large-scale superconducting quantum circuits*
9:36 AM–9:48 AM
Presenter:
Go Fujii
( National Institute of Advanced Industrial Science and Technology (AIST))
Authors:
Go Fujii
( National Institute of Advanced Industrial Science and Technology (AIST))
Masahiro Ukibe
( National Institute of Advanced Industrial Science and Technology (AIST))
Kazumasa Makise
( National Institute of Advanced Industrial Science and Technology (AIST))
Mutsuo Hidaka
( National Institute of Advanced Industrial Science and Technology (AIST))
Shuichi Nagasawa
( National Institute of Advanced Industrial Science and Technology (AIST))
Hirotake Yamamori
( National Institute of Advanced Industrial Science and Technology (AIST))
Kunihiro Inomata
( National Institute of Advanced Industrial Science and Technology (AIST))
Takahiro Yamada
( National Institute of Advanced Industrial Science and Technology (AIST))
Shiro Kawabata
( National Institute of Advanced Industrial Science and Technology (AIST))
Quantum annealing (QA) is one of quantum techniques to solve combinatorial optimization and sampling problems. Recently, a commercial QA machine was developed by D-Wave Systems and has been used to solve various problems. We propose a new three-dimensional packaging structure, which realize a scalability and a flexibility of the circuit size according to the needs for solving problems by stacking qubit-chip, interposer, and package-substrate as much as necessary. However, in the three-dimensional packaging, generating heat in through-silicon vias (TSVs) used to connect the qubit and the package-substrate is a serious issue. In this work, we have developed Sn-filled superconducting TSV (SC-TSV) to solve the above issue. In the process of the SC-TSV fabrication, the Sn was completely filled in holes with a high-aspect-ratio by electroplating process. A diameter and depth of the SC-TSV were 50 μm and 400 μm, respectively. The SC-TSV exhibited a superconducting transition temperature of 3.3 K and a critical current value at 0.3 K was 100 μA. We have plan to improve the critical current for reliable large-scale QA machines.
*This presentation is based on results obtained from a project commissioned by the New Energy and Industrial Technology Development Organization (NEDO).
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.R33.7
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