Bulletin of the American Physical Society
APS March Meeting 2018
Volume 63, Number 1
Monday–Friday, March 5–9, 2018; Los Angeles, California
Session R01: Advances in Scanned Probe Microscopy IV
8:00 AM–11:00 AM,
Thursday, March 8, 2018
LACC
Room: 150A
Sponsoring
Unit:
GIMS
Chair: Christopher Gutierrez, Univ British Columbia
Abstract ID: BAPS.2018.MAR.R01.15
Abstract: R01.00015 : Multidimensional Mapping of Electrical properties using Fast Force Volume
10:48 AM–11:00 AM
Presenter:
Bede Pittenger
(AFM Unit, Bruker Nano Surfaces)
Authors:
Peter De Wolf
(AFM Unit, Bruker Nano Surfaces)
Zhuangqun Huang
(AFM Unit, Bruker Nano Surfaces)
Bede Pittenger
(AFM Unit, Bruker Nano Surfaces)
Mickael Febvre
(AFM Unit, Bruker Nano Surfaces)
Denis Mariolle
(CEA-Leti, MINATEC Campus)
Nicolas Chevalier
(CEA-Leti, MINATEC Campus)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.MAR.R01.15
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