Thursday, March 8, 2018
8:00AM - 8:12AM
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R01.00001: Three-Dimensional sub-10 nm resolution using Bessel Beam Microscopy
Chumki Chakraborty, Craig Snoeyink
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Thursday, March 8, 2018
8:12AM - 8:24AM
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R01.00002: Enhancing Microscopy through Deep Learning
Yair Rivenson, Zoltán Göröcs, Harun Günaydin, Yibo Zhang, Hongda Wang, Aydogan Ozcan
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Thursday, March 8, 2018
8:24AM - 8:36AM
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R01.00003: Phase Retrieval and Hologram Reconstruction Using a Neural Network
Yair Rivenson, Yibo Zhang, Harun Günaydin, Da Teng, Aydogan Ozcan
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Thursday, March 8, 2018
8:36AM - 8:48AM
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R01.00004: XTIP - A New Dedicated Beamline for Synchrotron X-ray Scanning Tunneling Microscopy
Volker Rose, Nozomi Shirato, Saw-Wai Hla, Ruben Reininger, Mike Fisher
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Thursday, March 8, 2018
8:48AM - 9:00AM
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R01.00005: Buried Interface Magnetism and Near Edge X-ray Absorption Fine Structures Probed by Synchrotron X-ray STM
Hao Chang, Nozomi Shirato, Marvin Cummings, Daniel Rosenmann, John Freeland, Volker Rose, Saw Hla
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Thursday, March 8, 2018
9:00AM - 9:12AM
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R01.00006: Nanoscale Visualization of Schottky Barrier Interfaces with Ballistic Electron Emission Microscopy
Westly Nolting, Jack Rogers, Steven Gassner, Dan Pennock, Joshua Goldberg, Vincent LaBella
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Thursday, March 8, 2018
9:12AM - 9:24AM
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R01.00007: Nanoscale Electrochemistry via Lithium Focused Ion Beam
William McGehee, Evgheni Strelcov, Jamie Gardner, Saya Takeuchi, Oleg Kirrilov, Vladimir Oleshko, David Gundlach, Christopher Soles, Nikolai Zhitenev, Jabez McClelland
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Thursday, March 8, 2018
9:24AM - 9:36AM
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R01.00008: In-situ quantum transport measurement system in the milliKelvin range
Shimin Cao, Chaoyi Cai, Chuanwu Cao, Zhijian Xie, Guangyi Chen, Shaomian Qi, Jianhao Chen
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Thursday, March 8, 2018
9:36AM - 9:48AM
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R01.00009: Single-Crystalline Micro-Oscillators: Elastic Constants in Strongly Correlated Electron Systems on the Micrometer Scale
Amelia Estry, Maja Bachmann, Toni Helm, Philip Moll
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Thursday, March 8, 2018
9:48AM - 10:00AM
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R01.00010: Cryogenic imaging of metal-insulator transitions and quantum hall edge states using a commercial Atomic Force Microscope with Scanning Microwave Impedance Microscopy (sMIM)
Yongliang Yang, Oskar Amster
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Thursday, March 8, 2018
10:00AM - 10:12AM
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R01.00011: Scattering-Type Scanning Near-Field Optical Microscopy for Optical Microscopy and Spectroscopy at the Nanoscale
Max Eisele, Adrian Cernescu, Nicolai Hartmann
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Thursday, March 8, 2018
10:12AM - 10:24AM
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R01.00012: Phase Contrast in Scanning Transmission Electron Microscopy with Nanostructured Phase Gratings
Tyler Harvey, Colin Ophus, Fehmi Yasin, Jordan Chess, Jordan Pierce, Benjamin McMorran
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Thursday, March 8, 2018
10:24AM - 10:36AM
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R01.00013: Nanoprinting of Metallic Conductive Inks with Fountain Pen Nanolithography
Aaron Lewis, Talia Yeshua, Rimma Dechter, Uwe Huebner, Shlomo Magdassi, Michael Layan
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Thursday, March 8, 2018
10:36AM - 10:48AM
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R01.00014: Atomic magnetometer-based high-sensitivity multichannel magnetic sensor
Young Jin Kim, Igor Savukov
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Thursday, March 8, 2018
10:48AM - 11:00AM
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R01.00015: Multidimensional Mapping of Electrical properties using Fast Force Volume
Peter De Wolf, Zhuangqun Huang, Bede Pittenger, Mickael Febvre, Denis Mariolle, Nicolas Chevalier
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