Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session K21: Keithley Award SessionInvited Prize/Award
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Sponsoring Units: GIMS Chair: Angela Hight-Walker, NIST Room: 281-282 |
Wednesday, March 15, 2017 8:00AM - 8:36AM |
K21.00001: Observing Fast Fluctuations in Condensed Matter: X-Ray Photon Correlation Spectroscopy (XPCS) Performed with the Fast CCD (FCCD) Invited Speaker: Alec Sandy Fast, small-pixel, hard-x-ray-sensitive, area detectors capable of faithfully recording small numbers of scattered photons in short exposure times with high fidelity are key for advancing the capability of multispeckle XPCS to observe spontaneous fluctuations in condensed matter across a wide range of time and length scales. Also desirable is an open control architecture that enables the development of high-performance, closely-integrated application-specific detector data processing as far upstream as possible in the acquisition sequence. The FCCD is ideally suited to meet these requirements. I will describe Advanced Photon Source (APS) beamline 8-ID-I's implementation of the FCCD to perform fast multi-speckle XPCS with full-frame time sensitivity to 10 ms and effectively no dead time between frames using frame-transfer mode. We have leveraged this capability to provide a variably-sized area of interest mode that provides even faster time sampling over reduced collection areas. I will also discuss the integration of the FCCD with high-performance computing capabilities (HPC) in the control crate for producing upstream-compressed data streams that allow the acquisition of 100,000 or more detector frames without pausing. Upstream compression also enables rapid streaming of FCCD data away from the detector and close integration with external HPC resources that rapidly reduce speckle pattern time sequences to physically meaningful time autocorrelation functions. Beamline productivity is greatly increased by this capability. Lastly, I will present selected science applications in soft matter enabled by the FCCD system, namely unusual diffusion observed in nanoparticle fluids and in polymer nanocomposites. [Preview Abstract] |
Wednesday, March 15, 2017 8:36AM - 9:12AM |
K21.00002: You can't measure what you can't see -- detectors for microscopies Invited Speaker: Peter Denes For centuries, the human eye has been the imaging detector of choice thanks to its high sensitivity, wide dynamic range, and direct connection to a built-in data recording and analysis system. The eye, however, is limited to visible light, which excludes microscopies with electrons and X-rays, and the built-in recording system stores archival information at very low rates. The former limitation has been overcome by ``indirect'' detectors, which convert probe particles to visible light, and the latter by a variety of recording techniques, from photographic film to semiconductor-based imagers. Semiconductor imagers have been used for decades as ``direct'' detectors in particle physics, and almost as long for hard X-rays. For soft X-ray microscopy, the challenge has been the small signal levels -- plus getting the X-rays into the detector itself, given how quickly they are absorbed in inert layers. For electron microscopy, the challenge has been reconciling detector spatial resolution and pixel count with the large multiple scattering of electrons with energies used for microscopy. Further, a high recording rate (``movies'' rather than ``snapshots'') enables time-resolved studies, time-dependent corrections, shot-by-shot experiments and scanning techniques -- at the expense of creating large data volumes. This talk will discuss solutions to these challenges, as well as an outlook towards future developments. [Preview Abstract] |
Wednesday, March 15, 2017 9:12AM - 9:48AM |
K21.00003: Ultra-high Resolution Coherent X-ray Imaging of Nano-Materials Invited Speaker: David Shapiro A revolution is underway in the field of x-ray microscopy driven by the develop of experimental, theoretical and computational means of producing a complete description of coherent imaging systems from x-ray diffraction data. The methods being developed not only allow for full quantification and removal of all optical aberrations but also extension of the numerical aperture to the diffraction limit. One such method under intensive development is x-ray ptychography. This is a scanned probe method that reconstructs a scattering object and its illumination from coherent diffraction data. Within the first few years of development at the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory, this method has already achieved the highest resolution x-ray images ever recorded in two, three and four dimensions. With the ability of x-rays to penetrate significantly more matter than electrons, their short wavelength and their sensitivity to chemical and magnetic states of matter, x-ray ptychography is set to revolutionize how we see the nano-scale world. In this presentation I will briefly describe the technical framework for how various methods work and will give a detailed account of a practical implementation at the ALS along with various scientific applications. [Preview Abstract] |
Wednesday, March 15, 2017 9:48AM - 10:24AM |
K21.00004: Fast x-ray and electron detectors at SLAC user facilities using CCD and CMOS technology. Invited Speaker: Gabriella Carini The LCLS facility has been operational since 2009, providing ultrashort pulses (from a few-fs to \textgreater 100 fs), at high brightness, over an energy range from \textasciitilde 250 to \textasciitilde 12,800 eV, at 120 Hz. The unique characteristics of the source demanded a dedicated detector development which has produced a series of cameras used in a variety of experiments. A new upgrade project, the LCLS-II, is underway and will provide an increased repetition rate up to \textasciitilde 1 million per second. It will be the world's only X-ray free-electron laser capable of supplying a uniformly-spaced train of pulses with programmable repetition rate. These dramatic upgrade requires a correspondent detector R{\&}D plan. To exploit synergy and complementarity with the LCLS, SLAC has developed the Ultrafast Electron Diffraction (UED) program. The facility provides multi-MeV relativistic electron pulses to achieve a temporal resolution of \textasciitilde 100 fs at 180 Hz rate requiring fast imaging electron detectors. In this talk detectors used and being developed for these facilities will be presented with particular emphasis on CCD and CMOS technologies. [Preview Abstract] |
Wednesday, March 15, 2017 10:24AM - 11:00AM |
K21.00005: New modes of electron microscopy for materials science enabled by fast direct electron detectors Invited Speaker: Andrew Minor There is an ongoing revolution in the development of electron detector technology that has enabled modes of electron microscopy imaging that had only before been theorized. The age of electron microscopy as a tool for imaging is quickly giving way to a new frontier of multidimensional datasets to be mined. These improvements in electron detection have enabled cryo-electron microscopy to resolve the three-dimensional structures of non-crystalized proteins, revolutionizing structural biology. In the physical sciences direct electron detectors has enabled four-dimensional reciprocal space maps of materials at atomic resolution, providing all the structural information about nanoscale materials in one experiment. This talk will highlight the impact of direct electron detectors for materials science, including a new method of scanning nanobeam diffraction. With faster detectors we can take a series of 2D diffraction patterns at each position in a 2D STEM raster scan resulting in a four-dimensional data set. For thin film analysis, direct electron detectors hold the potential to enable strain, polarization, composition and electrical field mapping over relatively large fields of view, all from a single experiment. [Preview Abstract] |
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