Bulletin of the American Physical Society

APS March Meeting 2017

Volume 62, Number 4

Monday–Friday, March 13–17, 2017; New Orleans, Louisiana

Session Index

Session K21: Keithley Award Session

Invited Session Prize/Award

Show Abstracts

Sponsoring Units: GIMS
Chair: Angela Hight-Walker, NIST
Room: 281-282

Wednesday, March 15, 2017 8:00AM - 8:36AM		K21.00001: Observing Fast Fluctuations in Condensed Matter: X-Ray Photon Correlation Spectroscopy (XPCS) Performed with the Fast CCD (FCCD) Invited Speaker: Alec Sandy Preview Abstract
Wednesday, March 15, 2017 8:36AM - 9:12AM		K21.00002: You can't measure what you can't see -- detectors for microscopies Invited Speaker: Peter Denes Preview Abstract
Wednesday, March 15, 2017 9:12AM - 9:48AM		K21.00003: Ultra-high Resolution Coherent X-ray Imaging of Nano-Materials Invited Speaker: David Shapiro Preview Abstract
Wednesday, March 15, 2017 9:48AM - 10:24AM		K21.00004: Fast x-ray and electron detectors at SLAC user facilities using CCD and CMOS technology. Invited Speaker: Gabriella Carini Preview Abstract
Wednesday, March 15, 2017 10:24AM - 11:00AM		K21.00005: New modes of electron microscopy for materials science enabled by fast direct electron detectors Invited Speaker: Andrew Minor Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2017

Volume 62, Number 4

Monday–Friday, March 13–17, 2017; New Orleans, Louisiana

Session Index

Session K21: Keithley Award Session

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