APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017;
New Orleans, Louisiana
Session Index
Session H29: Role of Measurements and Instrumentation in Advancing Industry and Applied Physics
Industry
Invited
Undergraduate
|
Show Abstracts |
Sponsoring Units: FIAP GIMS
Chair: Dave Seiler, Angie Hight-Walker, NIST
Room: 292
|
|
Tuesday, March 14, 2017
2:30PM - 3:06PM
|
|
H29.00001: With Great Measurements Come Great Results
Invited Speaker:
Carl Williams
Preview Abstract |
Tuesday, March 14, 2017
3:06PM - 3:42PM
|
|
H29.00002: New Measurement Technology Enables the Revolution in the Life Sciences
Invited Speaker:
James Hollenhorst
Preview Abstract |
Tuesday, March 14, 2017
3:42PM - 4:18PM
|
|
H29.00003: Enabling Automotive Innovation: Tales from a Physicist in Industry
Invited Speaker:
Frederick Pinkerton
Preview Abstract |
Tuesday, March 14, 2017
4:18PM - 4:54PM
|
|
H29.00004: Semiconductor Characterization: from Growth to Manufacturing
Invited Speaker:
Luigi Colombo
Preview Abstract |
Tuesday, March 14, 2017
4:54PM - 5:30PM
|
|
H29.00005: Look but don't touch: Spectroscopic ellipsometry advances materials research and process monitoring
Invited Speaker:
Thomas Tiwald
Preview Abstract |
