Bulletin of the American Physical Society

APS March Meeting 2017

Volume 62, Number 4

Monday–Friday, March 13–17, 2017; New Orleans, Louisiana

Session Index

Session H29: Role of Measurements and Instrumentation in Advancing Industry and Applied Physics

Industry Invited Session Undergraduate Students

Show Abstracts

Sponsoring Units: FIAP GIMS
Chair: Dave Seiler, Angie Hight-Walker, NIST
Room: 292

Tuesday, March 14, 2017 2:30PM - 3:06PM		H29.00001: With Great Measurements Come Great Results Invited Speaker: Carl Williams Preview Abstract
Tuesday, March 14, 2017 3:06PM - 3:42PM		H29.00002: New Measurement Technology Enables the Revolution in the Life Sciences Invited Speaker: James Hollenhorst Preview Abstract
Tuesday, March 14, 2017 3:42PM - 4:18PM		H29.00003: Enabling Automotive Innovation: Tales from a Physicist in Industry Invited Speaker: Frederick Pinkerton Preview Abstract
Tuesday, March 14, 2017 4:18PM - 4:54PM		H29.00004: Semiconductor Characterization: from Growth to Manufacturing Invited Speaker: Luigi Colombo Preview Abstract
Tuesday, March 14, 2017 4:54PM - 5:30PM		H29.00005: Look but don't touch: Spectroscopic ellipsometry advances materials research and process monitoring Invited Speaker: Thomas Tiwald Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2017

Volume 62, Number 4

Monday–Friday, March 13–17, 2017; New Orleans, Louisiana

Session Index

Session H29: Role of Measurements and Instrumentation in Advancing Industry and Applied Physics

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