Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session H29: Role of Measurements and Instrumentation in Advancing Industry and Applied PhysicsIndustry Invited Undergraduate
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Sponsoring Units: FIAP GIMS Chair: Dave Seiler, Angie Hight-Walker, NIST Room: 292 |
Tuesday, March 14, 2017 2:30PM - 3:06PM |
H29.00001: With Great Measurements Come Great Results Invited Speaker: Carl Williams Measurements are the foundation for science and modern life. Technologies we take for granted every day depend on them---cell phones, CAT scans, pharmaceuticals, even sports equipment. Metrology, or measurement science, determines what industry can make reliably and what they cannot. At the National Institute of Standards and Technology (NIST) we specialize in making world class measurements that an incredibly wide range of industries use to continually improve their products -- computer chips with nanoscale components, atomic clocks that you can hold in your hand, lasers for both super-strong welds and delicate eye surgeries. Think of all the key technologies developed over the last 100 years and better measurements, standards, or analysis techniques played a role in making them possible. NIST works collaboratively with industry researchers on the advanced metrology for tomorrow's technologies. A new kilogram based on electromagnetic force, cars that weigh half as much but are just as strong, quantum computers, personalized medicine, single atom devices -- it's all happening in our labs now. This talk will focus on how metrology creates the future. [Preview Abstract] |
Tuesday, March 14, 2017 3:06PM - 3:42PM |
H29.00002: New Measurement Technology Enables the Revolution in the Life Sciences Invited Speaker: James Hollenhorst We are living through an unprecedented period of human history in which the mysteries of life are finally being explained. After languishing for centuries as a descriptive science, biology has been transformed by a triumph of the reductionist approach. ``Follow the molecules!'' We now understand the fundamental mechanisms of life at the molecular level; however, we are just at the beginning of unraveling the tremendous complexity underlying even the simplest life forms. This revolution is driven by our advancing measurement capability which, in turn, is driven by exponential advances in technology over the last 50 years. Borrowing ideas from the electronics industry, millions of measurements are done simultaneously, dropping the cost of each measurement by many orders of magnitude. In this talk, I will give several examples of these measurement technologies, our advancing understanding of life, and some of the exciting prospects for the future. [Preview Abstract] |
Tuesday, March 14, 2017 3:42PM - 4:18PM |
H29.00003: Enabling Automotive Innovation: Tales from a Physicist in Industry Invited Speaker: Frederick Pinkerton Measurements and instrumentation play an obvious and critical technical role in the automotive industry to assure compliance with government and industry standards such as emissions and fuel economy. Less obvious and equally critical is the role they play in innovative materials for future transportation needs. In today's open innovation environment, where research is distributed among industrial, academic, and government lab partners, the ability to capture, validate, and incorporate both internal and external inventions combines a deep knowledge base and the research tools to evaluate advanced materials and processes. Examples of the impact of measurements and instrumentation on internal, external, and shared research will be given from the experiences of the author and his research colleagues. [Preview Abstract] |
Tuesday, March 14, 2017 4:18PM - 4:54PM |
H29.00004: Semiconductor Characterization: from Growth to Manufacturing Invited Speaker: Luigi Colombo The successful growth and/or deposition of materials for any application require basic understanding of the materials physics for a given device. At the beginning, the first and most obvious characterization tool is visual observation; this is particularly true for single crystal growth. The characterization tools are usually prioritized in order of ease of measurement, and have become especially sophisticated as we have moved from the characterization of macroscopic crystals and films to atomically thin materials and nanostructures. While a lot attention is devoted to characterization and understanding of materials physics at the nano level, the characterization of single crystals as substrates or active components is still critically important. In this presentation, I will review and discuss the basic materials characterization techniques used to get to the materials physics to bring crystals and thin films from research to manufacturing in the fields of infrared detection, non-volatile memories, and transistors. Finally I will present and discuss metrology techniques used to understand the physics and chemistry of atomically thin two-dimensional materials for future device applications. [Preview Abstract] |
Tuesday, March 14, 2017 4:54PM - 5:30PM |
H29.00005: Look but don't touch: Spectroscopic ellipsometry advances materials research and process monitoring Invited Speaker: Thomas Tiwald Spectroscopic ellipsometry is a non-contact, non-destructive optical technique that can measure film thickness with a sub-nanometer precision, as well as the complex refractive index/dielectric function of films and substrates. Ellipsometers measure the change in polarization of light as it reflects from (or transmits through) a sample. Sample properties are determined by fitting the polarization information to models that are based on well-established scattering matrix theory and the Fresnel equations. Modern ellipsometers operate at ultraviolet, visible IR and THz spectral ranges. Some instruments measure hundreds or even thousands of wavelengths simultaneously. Such instruments can rapidly map film thickness and properties on wafers, photovoltaics and flat panel displays; as well as roll-to-roll coatings on metals, plastics and glass. They can also monitor deposition, etching, annealing, electrochemistry, biomolecule adsorption/desorption in liquid environments and other dynamic processes. In recent years, spectroscopic ellipsometers have been developed to measure all sixteen Mueller matrix elements, thus providing a complete description of a sample's polarization properties. Mueller matrix ellipsometry is used to characterize highly anisotropic samples, including gratings, nanopillars, and plasmonic structures; and is also used routinely to measure critical dimensions on semiconductor devices. Examples of some these applications will be presented during the talk. [Preview Abstract] |
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