Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session E36: Advances in Scanned Probe Microscopy I
8:00 AM–11:00 AM,
Tuesday, March 14, 2017
Room: 299
Sponsoring
Unit:
GIMS
Chair: Daniel Walkup, NIST
Abstract ID: BAPS.2017.MAR.E36.6
Abstract: E36.00006 : Visualizing the condensation of graphene whispering gallery modes into Landau levels in real-space
9:48 AM–10:00 AM
Preview Abstract Abstract
Authors:
Christopher Gutierrez
(Center for Nanoscale Science and Technology, NIST / Maryland NanoCenter, University of Maryland, College Park)
Daniel Walkup
(Center for Nanoscale Science and Technology, NIST / Maryland NanoCenter, University of Maryland, College Park)
Fereshte Ghahari
(Center for Nanoscale Science and Technology, NIST / Maryland NanoCenter, University of Maryland, College Park)
Kenji Watanabe
(National Institute for Materials Science)
Takashi Taniguchi
(National Institute for Materials Science)
Nikolai B. Zhitenev
(Center for Nanoscale Science and Technology, NIST)
Joseph A. Stroscio
(Center for Nanoscale Science and Technology, NIST)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAR.E36.6
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