Tuesday, March 14, 2017
8:00AM - 8:36AM
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E36.00001: Scanning superconducting quantum interference device measurements of variations in superconducting transition temperature of two-dimensionally doped SrTiO$_{3}$
Invited Speaker:
Hilary Noad
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Tuesday, March 14, 2017
8:36AM - 8:48AM
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E36.00002: Measuring exchange interactions between atomic spins using electron spin resonance STM
Kai Yang, William Paul, Fabian Natterer, Taeyoung Choi, Andreas Heinrich, Christopher Lutz
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Tuesday, March 14, 2017
8:48AM - 9:00AM
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E36.00003: A kilobyte rewritable atomic memory
Floris Kalff, Marnix Rebergen, Nora Fahrenfort, Jan Girovsky, Ranko Toskovic, Jose Lado, Joaquín Fernández-Rossier, Sander Otte
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Tuesday, March 14, 2017
9:00AM - 9:12AM
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E36.00004: Active current-noise cancellation for Scanning Tunneling Microscopy
Lavish Pabbi, Conner Shoop, Riju Banerjee, Bill Dusch, E.W. Hudson
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Tuesday, March 14, 2017
9:12AM - 9:48AM
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E36.00005: An On/Off Berry Phase Switch in Circular Graphene Resonators
Invited Speaker:
Fereshte Ghahari
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Tuesday, March 14, 2017
9:48AM - 10:00AM
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E36.00006: Visualizing the condensation of graphene whispering gallery modes into Landau levels in real-space
Christopher Gutierrez, Daniel Walkup, Fereshte Ghahari, Kenji Watanabe, Takashi Taniguchi, Nikolai B. Zhitenev, Joseph A. Stroscio
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Tuesday, March 14, 2017
10:00AM - 10:12AM
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E36.00007: Detection of overtone vibrations in single molecules by the scanning tunneling microscope
Gregory Czap, Peter Wagner, Zhumin Han, Jiang Yao, Wilson Ho
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Tuesday, March 14, 2017
10:12AM - 10:24AM
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E36.00008: Probing Intermolecular Coupled Vibrations by STM Inelastic Electron Tunneling Spectroscopy.
Zhumin Han, Gregory Czap, Chen Xu, Chi-lun Chiang, Dingwang Yuan, Ruqian Wu, Wilson Ho
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Tuesday, March 14, 2017
10:24AM - 10:36AM
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E36.00009: Abstract Withdrawn
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Tuesday, March 14, 2017
10:36AM - 10:48AM
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E36.00010: A new way to make diamond tip hosting an atomic sized defect
Tony Zhou, Rainer Stohr, Yuliya Dovzhenko, Francesco Casola, Amir Yacoby
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Tuesday, March 14, 2017
10:48AM - 11:00AM
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E36.00011: A Field Emission Based Electromechanical System for Tunable, High-Resolution Position Sensing
Rudolph Resch, Benjamin Aleman
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