Evolution of multiple dielectric responses and relaxor-like behaviors in pure and nitrogen-ion-implanted (Ba, Sr)TiO$_{3}$ thin films

Multiple dielectric responses are comparatively investigated in the pure and nitrogen-ion-implanted (Ba, Sr)TiO$_{3}$ (BST) films. Larger diffusive degree of phase transition and more relaxor-like features than those of pure BST films are observed in implanted ones, where the long-range-dipolar-correlated-orders were further segregated into local polar orders after the implantation. Moreover, the implanted films possess a transition from local reorientations of groups of dipoles induced nearly-constant-loss (NCL) type to oxygen vacancies (V$_{o})$ hopping type conduction at high temperature. Whereas, pure films behave as NCL type conduction along with a dielectric relaxation, which arises from the motions of defect complexes V$_{o}^{2+}$-Ti$^{3+}$.