Bulletin of the American Physical Society

APS March Meeting 2015

Volume 60, Number 1

Monday–Friday, March 2–6, 2015; San Antonio, Texas

Session Index

Session F21: Focus Session: Advances in Scanned Probe Microscopy II: High Frequencies and Optical Techniques	Show Abstracts
Sponsoring Units: GIMS Chair: Fabian Natterer, National Institute of Standards and Technology Room: 201

Tuesday, March 3, 2015 8:00AM - 8:12AM		F21.00001: Measurement of Radiation Pressure in an Ambient Environment Dakang Ma, Joseph Garrett, Jeremy Munday Preview Abstract
Tuesday, March 3, 2015 8:12AM - 8:24AM		F21.00002: Sensitivity Improvement and Cryogenic Application of Scanning Microwave Microscope Hideyuki Takahashi, Yoshinori Imai, Atsutaka Maeda Preview Abstract
Tuesday, March 3, 2015 8:24AM - 8:36AM		F21.00003: Subsurface Imaging with the Scanning Microwave Microscope Joseph Kopanski, Lin You, Jonathan Michelson, Emily Hitz, Yaw Obeng Preview Abstract
Tuesday, March 3, 2015 8:36AM - 8:48AM		F21.00004: Advances in imaging and quantification of electrical properties at the nanoscale using Scanning Microwave Impedance Microscopy (sMIM) Stuart Friedman, Yongliang Yang, Oskar Amster Preview Abstract
Tuesday, March 3, 2015 8:48AM - 9:00AM		F21.00005: Analytical quantitative theory of RF-SPM for nanocarbon electronics Slava V. Rotkin Preview Abstract
Tuesday, March 3, 2015 9:00AM - 9:12AM		F21.00006: Ferromagnetic Resonance detection using stroboscopic magneto optical Kerr effect Seungha Yoon, Takahiro Moriyama, Robert McMichael Preview Abstract
Tuesday, March 3, 2015 9:12AM - 9:48AM		F21.00007: Time-resolved scanning tunneling microscopy for studies of nanoscale magnetization dynamics Invited Speaker: Sebastian Loth Preview Abstract
Tuesday, March 3, 2015 9:48AM - 10:00AM		F21.00008: A low temperature ultrahigh vacuum scanning tunneling microscope with high-NA optics to probe optical interactions at the atomic scale Haigang Zhang, Joseph Smerdon, Ozgun Suzer, Heath Kersell, Jeffrey Guest Preview Abstract
Tuesday, March 3, 2015 10:00AM - 10:12AM		F21.00009: Metal-Insulator Phase transition of VO$_2$ nano crystals studied by near-field nanoscopy Yohannes Abate Preview Abstract
Tuesday, March 3, 2015 10:12AM - 10:24AM		F21.00010: Determination of the dielectric function of materials with scattering-type scanning near field optical microscopy Peng Xu, T.J. Huffman, M.M. Qazilbash, Inhae Kwak, Amlan Biswas Preview Abstract
Tuesday, March 3, 2015 10:24AM - 10:36AM		F21.00011: Generalized method of eigenoscillations for near-field optical microscopy Bor-Yuan Jiang, Lingfeng Zhang, Antonio Castro Neto, Dimitri Basov, Michael Fogler Preview Abstract
Tuesday, March 3, 2015 10:36AM - 10:48AM		F21.00012: Cryogenic Near-Field Microscopy in Correlated Electronic Systems Adrian Gozar Preview Abstract
Tuesday, March 3, 2015 10:48AM - 11:00AM		F21.00013: Radiation pressure excitation of Low Temperature Atomic Force {\&} Magnetic Force Microscope (LT-AFM/MFM) for Imaging Ozgur Karci, Umit Celik, Ahmet Oral Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2015

Volume 60, Number 1

Monday–Friday, March 2–6, 2015; San Antonio, Texas

Session Index

Session F21: Focus Session: Advances in Scanned Probe Microscopy II: High Frequencies and Optical Techniques

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