In-situ x-ray scattering investigation of strain in thin-film morphological evolution of homoepitaxial Ag(001)*

Because it escapes detection in most experimental probes of surfaces, the role of strain during film growth has not been widely investigated. However, large strain fields arise from vacancy nano-clusters [C. Kim et al., APL \textbf{91}, 093131 (2007)] that can be incorporated during film growth at lower temperatures. It has also been suggested that extreme surface morphologies, resulting from a deposition flux at grazing angles, might lead to significant strain [Y. Shim et. al., PRL \textbf{101}, 11601 (2008)]. Because of its simultaneous sensitivity to both the surface and the subsurface, x-ray scattering is a particularly valuable technique for exploring the role of strain in epitaxial crystal growth. This talk will discuss our recent in-situ x-ray diffuse scattering and reflectivity measurements, performed at the Advanced Photon Source, which investigate the low temperature homoepitaxial growth of Ag(001).