Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session Y32: Novel Instrumentation & Techniques in Surface Science
8:00 AM–11:00 AM,
Friday, March 19, 2010
Room: E142
Sponsoring
Unit:
DMP
Chair: William Cullen, University of Maryland
Abstract ID: BAPS.2010.MAR.Y32.5
Abstract: Y32.00005 : Scanning transmission X-ray microscopy imaging of the grain orientation in a pentacene field-effect transistor*
8:48 AM–9:00 AM
Preview Abstract
Abstract
Authors:
Bjoern Braeuer
(Stanford University)
Ajay Virkar
(Stanford University)
Stefan Mannsfeld
(Stanford University)
David Bernstein
(Stanford University)
Kang Wei Chou
(Stanford University)
Roopali Kukreja
(Stanford University)
Zhenan Bao
(Stanford University)
Yves Acremann
(Stanford University)
*B. B. thanks the German Research Foundation (DFG) for a postdoctoral fellowship. A. V. and Z. B. thank the financial support from the NSF sponsored MRSEC (DMR 0213618) and NSF Solid State Chemistry (DMR 0705687.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.Y32.5
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