Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session J15: Focus Session: Advances in Scanned Probe Microscopy II: Optical Techniques |
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Sponsoring Units: GIMS Chair: Andreas Heinrich, IBM Almaden Research Center Room: B114 |
Tuesday, March 16, 2010 11:15AM - 11:51AM |
J15.00001: Laser-combined STM and probing ultrafast transient dynamics Invited Speaker: ``Smaller" and ``Faster" are the main concepts in nanoscale science and technology. With the size reduction in structures, the difference in the electronic properties, for example, caused by the structural nonuniformity in each element, has an ever more crucial influence on macroscopic functions. And the direct observation of the characteristics, which provides us with the basis for the macroscopic analysis of the results, is of great importance. Thus, for further advances, a method of exploring the transient dynamics of the local quantum functions in organized small structures is eagerly desired. STM has an excellent spatial resolution on the subangstrom scale. However, since its temporal resolution is limited by the circuit bandwidth ($\sim$100 kHz), increasing its potential by, for example, combining its characteristics with those of other techniques has been desired. One of the promising approaches is to control the material conditions, in STM measurement, using the techniques of quantum optics. Ultrashort optical pulse technology has enabled us to observe transient phenomena in the femtosecond range, the optical-monocycle region, which, however, has a drawback of a relatively low spatial resolution due to the electromagnetic wavelength. Therefore, realizing the time-resolved tunneling current measurement in the subpicosecond range by developing STM combined with an ultrashort-pulse laser has been a challenging subject for obtaining the ultimate spatial and temporal resolutions simultaneously. I would like to review our researches and efforts on the laser-combined STM and related techniques we have developed, with some latest results obtained based on them. \newline \newline http://dora.ims.tsukuba.ac.jp \newline [1] Y. Terada, et al., Nanotechnology 18, 044028 (2006). \newline[2] S. Yoshida et al., Phys. Rev. Lett. 98, 026802 (2007). [Preview Abstract] |
Tuesday, March 16, 2010 11:51AM - 12:03PM |
J15.00002: Measuring nanorod diffusion in 3D with holographic video microscopy Fook Chiong Cheong, David Grier In this work, we demonstrate the use of holographic video microscopy for imaging nanorods in three dimensions with video-rate time resolution. We use computer reconstructions of the light fields captured in each video snapshot to measure the nanorod's position and orientation. Information from a video sequence then enable us to measure the nanorod's three-dimensional translational and rotational diffusion in water. Comparison with predictions for the diffusion of prolated ellipsoids reveals excellent agreement with the nanorod dimensions measured holographically and those deduced from the nanorod's dynamics. [Preview Abstract] |
Tuesday, March 16, 2010 12:03PM - 12:15PM |
J15.00003: ABSTRACT WITHDRAWN |
Tuesday, March 16, 2010 12:15PM - 12:27PM |
J15.00004: Spectroscopy of single emitters using a scanning optical microscope in a dilution refrigerator Saikat Ghosh, Colin Heikes, Frank Wise, Alexander Gaeta, Dan Ralph We report the design and implementation of a fiber-based optical scanning microscope, capable of operating at temperatures down to 20 mK and in magnetic fields in excess of 9 Tesla, with sub-micron spatial resolution and ultra-low light levels. A home-made modular, piezo-based scanning head is at the heart of the design, with optical fibers coupling light in and out of a commercial dilution refrigerator. The microscope can be operated both in transmission and reflection modes. In the transmission mode, we can analyze the polarization of the light transmitted through the sample down to femto-Watt light levels, using detectors and polarizers integrated with the scanning head inside the refrigerator. In the reflection mode, the instrument can be operated in a confocal geometry in conjunction with single photon counting modules to measure anti-bunching and the decay times of fluorescent photons. We are using this microscope to study individual nano- emitters, focusing initially on spin dynamics in semiconductor quantum dots. [Preview Abstract] |
Tuesday, March 16, 2010 12:27PM - 12:39PM |
J15.00005: High RF Magnetic Field Near-Field Microwave Microscope Tamin Tai, Dragos I. Mircea, Steven M. Anlage Near-field microwave microscopes have been developed to quantitatively image RF and microwave properties of a variety of materials on deep sub-wavelength scales [1]. Microscopes that develop high-RF magnetic fields on short length scales are useful for examining the fundamental electrodynamic properties of superconductors [2]. We are creating a new class of near-field microwave microscopes that develop RF fields on the scale of 1 Tesla on sub-micron length scales. These microscopes will be employed to investigate defects that limit the RF properties of bulk Nb materials used in accelerator cavities, and the nonlinear Meissner effect in novel superconductors. Work funded by the US Department of Energy. [1] S. M. Anlage, V. V. Talanov, A. R. Schwartz, ``\textbf{Principles of Near-Field Microwave Microscopy},'' in \textit{Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, Volume 1, }edited by S. V. Kalinin and A. Gruverman (Springer-Verlag, New York, 2007), pp. 215-253. [2] D. I. Mircea, H. Xu, S. M. Anlage, ``\textbf{Phase-sensitive Harmonic Measurements of Microwave Nonlinearities in Cuprate Thin Films},'' Phys. Rev. B \textbf{80}, 144505 (2009). [Preview Abstract] |
Tuesday, March 16, 2010 12:39PM - 12:51PM |
J15.00006: Observation of atomically resolved HOPG and Au surfaces in ambient conditions using the microwave channels of a hybrid STM/microwave microscope based on a resonant microwave cavity Jonghee Lee, Christian J. Long, Haitao Yang, Ichiro Takeuchi We report on the development of a hybrid STM/microwave microscope which combines the spatial resolution of STM with the high-frequency characterization capabilities of a resonant microwave cavity. The microwave cavity is integrated into the scanner head of the STM and electrically coupled to the sample through the STM tip. The resonator has a fundamental resonance frequency of 2.4 GHz and an unloaded quality factor of 600. While scanning over a sample surface, we can simultaneously monitor the DC tunneling current, the cavity resonance frequency, and cavity quality factor. We find that our hybrid STM is capable of atomic resolution imaging of HOPG and Au surfaces in ambient conditions. Atomic resolution can be obtained using only the microwave channels, only the STM topography, or both simultaneously. We discuss the detailed features of this state-of-the-art hybrid STM and future applications. [Preview Abstract] |
Tuesday, March 16, 2010 12:51PM - 1:03PM |
J15.00007: Nano-imaging in the black-body infrared near-field. Andrew C. Jones, Markus B. Raschke In order to probe material properties on the nanoscale, Scanning Near-field Optical Microscopy (SNOM) traditionally relies on the use of external far-field light sources. Recent experiments have demonstrated the alternative use of the evanescent thermal black-body radiation in scattering-SNOM [1]. Here, we explore the use of both heated samples and heated probe tips for scattering type SNOM in combination with Fourier transform infrared spectroscopy (FTIR) of the scattered thermal blackbody near-field radiation of IR nano-antennas and surface phonon excitations. We relate the observed and theoretically expected signal strength with the resonantly enhanced electromagnetic near-field density of states. Our result illustrates the potential as well as the limitations of the use of thermal evanescent fields for nano-imaging. [1] De Wilde, Y. et al. Nature. 444:740-743 (2006) [Preview Abstract] |
Tuesday, March 16, 2010 1:03PM - 1:15PM |
J15.00008: Plasmonic focusing on a tip for spectroscopic nano-imaging Samuel Berweger, Catalin C. Neacsu, Robert L. Olmon, Laxmikant V. Saraf, Claus Ropers, Markus B. Raschke The focusing of light into sub-diffraction limit dimensions has been a long-standing challenge in imaging and spectroscopy. Here, we study the adiabatic concentration of propagating surface plasmon polaritons on a tapered metal tip into a localized and enhanced nanoscale excitation at the apex. Using far-field spectroscopic characterization and near-field imaging we demonstrate spatial confinement of the radially symmetric TM mode (m = 0) to within just several 10s of nm as determined by the apex radius. Ultrahigh spatial resolution near-field Raman and luminescence imaging is demonstrated with enhanced sensitivity and minimal far-field background. [Preview Abstract] |
Tuesday, March 16, 2010 1:15PM - 1:27PM |
J15.00009: Dual Mode AFM/Ellipsometer Imaging Jianghua Bai, John Freeouf, Andres La Rosa We have constructed an apertureless NSOM system which combines a null ellipsometer with an AFM. The polarized laser beam of the ellipsometer shines on both the sample and the AFM tip, while the tip is scanned across the sample surface. The AFM tip is mounted on a crystal tuning fork (TF) oscillating at its nominal resonant frequency. The reflected light passes through a compensator and analyzer and is collected by a photomultiplier tube. Both 1$^{st}$ and 3$^{rd}$ orders of the reflected light have been measured to determine the optical properties of the sample. We have measured the response of the TF and modeled its behavior in the overall system response. We shall discuss the operation of the AFM system and the optical response observed for operation with the AFM in both ``sweeping'' mode and ``tapping'' mode. We shall show results for various samples, including ``hard'' samples such as silicon on sapphire, and ``soft'' samples such as polymers on glass slides. [Preview Abstract] |
Tuesday, March 16, 2010 1:27PM - 1:39PM |
J15.00010: Phonon resonant spectroscopic recognition of 4 nm silicon nitride particles by infrared near field microscopy Yohannes Abate, Johannes Stiegler, Yaroslav Romanyuk, Andy Huber, Stephen Leone, Rainer Hillenbrand Silicon nitride polar dielectric nanoparticles, grown by high-temperature high vacuum reaction of Si(100) with a nitrogen plasma, are imaged using optical near-field microscopy in the infrared. Phonon resonant particles as small as 4 nm in size are detected, indicating a spatial resolution of $\sim \quad \lambda $/700, where $\lambda $ is the wavelength of light. Locally excited silicon nitride phonon polariton resonances occur around 934 cm$^{-1}$ and increase in intensity with the size of the nanoparticles. Experimental results are in very good agreement with dielectric function model calculations for thin films in the extended dipole approximation. [Preview Abstract] |
Tuesday, March 16, 2010 1:39PM - 1:51PM |
J15.00011: Effect of probe-sample gap atmosphere on shear-force distance feedback using a near-field scanning microwave microscope Nikolai Kalugin, Lee Wickey, Vladimir Talanov We investigated the effect of various gases (ambient air, Nitrogen, Argon, Helium, and Oxygen) on a probe-sample shear-force distance control in scanning probe microscopy. To quantitatively measure a change in the probe-sample distance due to a gas effect we employed a near-field scanning probe microwave microscope [1], which provides for independent measurement of changes in the distance with 0.1 nm resolution. A heavily doped Si wafer was used as a sample. We found that while air and Oxygen yield similar probe-sample distance, Nitrogen, Argon, and Helium increase it by 1-3 nanometers. Using Argon we also observed a reduction in the shear-force noise from 0.5 nm down to 0.25 nm, which is an important factor for making quantitative measurements. The data suggest that the major contribution into shear force is the attractive Coulomb force due to localized surface charges and/or surface potential difference. [1] V. V. Talanov, A. Scherz, R. L. Moreland, and A. R. Schwartz, Appl. Phys. Lett. \textbf{88}, 134106 (2006). [Preview Abstract] |
Tuesday, March 16, 2010 1:51PM - 2:03PM |
J15.00012: Development of a scanning microwave microscope for localized ferromagnetic resonance measurements Christian J. Long, Stephen A. Kitt, Jonghee Lee, Samuel Lofland, Ichiro Takeuchi We present an update on our research into the development of a scanning probe microscope capable of performing localized ferromagnetic resonance (FMR) measurements. The system is based on near-field microwave microscopy and uses a resonant microwave cavity operating at $\sim $2.5 GHz with a quality factor of $\sim $500. A sharpened metallic tip extends out of the resonator and produces a GHz frequency magnetic field in the region around the probe tip. By recording the change in the quality factor of the resonator as a function of applied DC magnetic field, we measure the absorption of microwave energy by a sample in the region around the tip. As an example system, we explore a single crystal Ga:YIG disk. For the case of a DC magnetic field oriented out of the plane of the disk, the FMR absorption lines form rings which are concentric with the disk axis. We find qualitative agreement between the observed absorption patterns and the absorptions patterns from numerical simulations of magnetostatic spin wave modes. The numerical simulations are carried out using the RKMAG software. [Preview Abstract] |
Tuesday, March 16, 2010 2:03PM - 2:15PM |
J15.00013: Near-field Optical Measurement using Nano-Prism Probes Taekyeong Kim, Byung Yang Lee, Kwang Heo, Seunghun Hong, Ki Seok Jeon, Hyung Min Kim, Yung Doug Suh, Deok Soo Kim, Zee Hwan Kim Recently, a nano-prism (NP) structure has drawn attention as an optical nano-antenna due to its exotic optical properties, while it has been extremely difficult to prepare a probe terminated with a NP for near-field optical measurement. Herein, we report a method to mass-produce pristine NP-probes. Our fabrication process allowed us to prepare \textit{NPs with sharp edge at the end of the probes,} which significantly enhanced the electric fields around the probes and made the NP-probes ideal for nano-optical applications. We performed the apertureless near-field scanning optical microscopy on gold nanoparticles using a NP-probe, revealing the field localization at the vertices of the NP. We also achieved high resolution topographic imaging on carbon nanotubes and successfully performed the tip-enhanced Raman spectroscopy (TERS) experiment on brilliant cresyl blue (BCB) molecules, revealing a significant field localization at the sharp edge of the NP. This method could be a major breakthrough and provide tremendous flexibility for near-field optical applications. [Preview Abstract] |
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