Tuesday, March 16, 2010
11:15AM - 11:51AM
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J15.00001: Laser-combined STM and probing ultrafast transient dynamics
Invited Speaker:
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Tuesday, March 16, 2010
11:51AM - 12:03PM
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J15.00002: Measuring nanorod diffusion in 3D with holographic video microscopy
Fook Chiong Cheong, David Grier
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Tuesday, March 16, 2010
12:03PM - 12:15PM
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J15.00003: ABSTRACT WITHDRAWN
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Tuesday, March 16, 2010
12:15PM - 12:27PM
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J15.00004: Spectroscopy of single emitters using a scanning optical microscope in a dilution refrigerator
Saikat Ghosh, Colin Heikes, Frank Wise, Alexander Gaeta, Dan Ralph
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Tuesday, March 16, 2010
12:27PM - 12:39PM
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J15.00005: High RF Magnetic Field Near-Field Microwave Microscope
Tamin Tai, Dragos I. Mircea, Steven M. Anlage
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Tuesday, March 16, 2010
12:39PM - 12:51PM
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J15.00006: Observation of atomically resolved HOPG and Au surfaces in ambient conditions using the microwave channels of a hybrid STM/microwave microscope based on a resonant microwave cavity
Jonghee Lee, Christian J. Long, Haitao Yang, Ichiro Takeuchi
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Tuesday, March 16, 2010
12:51PM - 1:03PM
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J15.00007: Nano-imaging in the black-body infrared near-field.
Andrew C. Jones, Markus B. Raschke
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Tuesday, March 16, 2010
1:03PM - 1:15PM
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J15.00008: Plasmonic focusing on a tip for spectroscopic nano-imaging
Samuel Berweger, Catalin C. Neacsu, Robert L. Olmon, Laxmikant V. Saraf, Claus Ropers, Markus B. Raschke
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Tuesday, March 16, 2010
1:15PM - 1:27PM
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J15.00009: Dual Mode AFM/Ellipsometer Imaging
Jianghua Bai, John Freeouf, Andres La Rosa
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Tuesday, March 16, 2010
1:27PM - 1:39PM
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J15.00010: Phonon resonant spectroscopic recognition of 4 nm silicon nitride particles by infrared near field microscopy
Yohannes Abate, Johannes Stiegler, Yaroslav Romanyuk, Andy Huber, Stephen Leone, Rainer Hillenbrand
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Tuesday, March 16, 2010
1:39PM - 1:51PM
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J15.00011: Effect of probe-sample gap atmosphere on shear-force distance feedback using a near-field scanning microwave microscope
Nikolai Kalugin, Lee Wickey, Vladimir Talanov
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Tuesday, March 16, 2010
1:51PM - 2:03PM
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J15.00012: Development of a scanning microwave microscope for localized ferromagnetic resonance measurements
Christian J. Long, Stephen A. Kitt, Jonghee Lee, Samuel Lofland, Ichiro Takeuchi
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Tuesday, March 16, 2010
2:03PM - 2:15PM
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J15.00013: Near-field Optical Measurement using Nano-Prism Probes
Taekyeong Kim, Byung Yang Lee, Kwang Heo, Seunghun Hong, Ki Seok Jeon, Hyung Min Kim, Yung Doug Suh, Deok Soo Kim, Zee Hwan Kim
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