Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session D25: Focus Session: Dopants and Defects in Semiconductors - Nitrides, SiC
2:30 PM–5:30 PM,
Monday, March 15, 2010
Room: D135
Sponsoring
Unit:
DMP
Chair: Eugene Haller, Lawrence Berkeley National Laboratory
Abstract ID: BAPS.2010.MAR.D25.11
Abstract: D25.00011 : Strong hot electron reflection from subsurface 8H-SiC inclusion in 4H-SiC: Ballistic Electron Emission Microscopy (BEEM) study
4:54 PM–5:06 PM
Preview Abstract
Abstract
Authors:
K.-B. Park
(Ulsan National Institute of Science and Technology, Korea)
W. Cai
(The Ohio State University)
J.P. Pelz
(The Ohio State University)
M.S. Miao
(Case Western Reserve University)
W.R.L. Lambrecht
(Case Western Reserve University)
X. Zhang
(Carnegie Mellon University)
M. Skowronski
(Carnegie Mellon University)
M.A. Capano
(Purdue University)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.D25.11
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