Bulletin of the American Physical Society

APS March Meeting 2010

Volume 55, Number 2

Monday–Friday, March 15–19, 2010; Portland, Oregon

Session Index

Session D25: Focus Session: Dopants and Defects in Semiconductors - Nitrides, SiC	Show Abstracts
Sponsoring Units: DMP Chair: Eugene Haller, Lawrence Berkeley National Laboratory Room: D135

Monday, March 15, 2010 2:30PM - 3:06PM		D25.00001: Electrical properties of point and extended defects in indium nitride Invited Speaker: Preview Abstract
Monday, March 15, 2010 3:06PM - 3:18PM		D25.00002: Optical Properties of GaN/ZnO solid solutions studied by Density Functional Calculations Li Li, P. B. Allen Preview Abstract
Monday, March 15, 2010 3:18PM - 3:30PM		D25.00003: ABSTRACT WITHDRAWN Preview Abstract
Monday, March 15, 2010 3:30PM - 3:42PM		D25.00004: Theory of hot-carrier-induced phenomena in GaN high-electron-mobility transistors Yevgeniy Puzyrev, Blair Tuttle, Ronald Schrimpf, Daniel Fleetwood, Sokrates Pantelides Preview Abstract
Monday, March 15, 2010 3:42PM - 3:54PM		D25.00005: Stress-assisted migration of vacancies in GaN HEMTs Keith Warnick, Yevgeniy Puzyrev, Sokrates Pantelides Preview Abstract
Monday, March 15, 2010 3:54PM - 4:06PM		D25.00006: Mg-related EPR signal in high hole density GaN Mary Ellen Zvanut, Jamiyana Dashdorj Preview Abstract
Monday, March 15, 2010 4:06PM - 4:18PM		D25.00007: Gate Bias Dependent Two Layer Conduction in InAlN/AlN/GaN Heterostructures Hailing Cheng, Cagliyan Kurdak, Jacob Leach, Xianfeng Ni, Xing Li, Mo Wu, Umit Ozgur, Hadis Morkoc, Lin Zhou, David Smith, Igor Vurgaftman, Jerry Meyer Preview Abstract
Monday, March 15, 2010 4:18PM - 4:30PM		D25.00008: Structure and defects at the SiC:SiO$_{2}$ interface Blair Tuttle, Sokrates Pantelides Preview Abstract
Monday, March 15, 2010 4:30PM - 4:42PM		D25.00009: Carbon-Rich Silicon Carbide Xiao Shen, Yevgeniy Puzyrev, Gerd Duscher, Sokrates Pantelides Preview Abstract
Monday, March 15, 2010 4:42PM - 4:54PM		D25.00010: Carbon defects at the SiC-SiO$_{2}$ interface and the effects of hydrogen and fluorine Yingdi Liu, Michael Halfmoon, Sanwu Wang Preview Abstract
Monday, March 15, 2010 4:54PM - 5:06PM		D25.00011: Strong hot electron reflection from subsurface 8H-SiC inclusion in 4H-SiC: Ballistic Electron Emission Microscopy (BEEM) study K.-B. Park, W. Cai, J.P. Pelz, M.S. Miao, W.R.L. Lambrecht, X. Zhang, M. Skowronski, M.A. Capano Preview Abstract
Monday, March 15, 2010 5:06PM - 5:18PM		D25.00012: First principles study of p-type conductivity in wide band gap Cu$_3$TaQ$_4$ (Q=S,Se,Te) semiconductors F.L. Barras, A. Zakutayev, G. Schneider Preview Abstract
Monday, March 15, 2010 5:18PM - 5:30PM		D25.00013: Origin of p-type conductivity in wide band gap BaCuQF (Q=S,Se,Te) semiconductors G. Schneider, A. Zakutayev Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2010

Volume 55, Number 2

Monday–Friday, March 15–19, 2010; Portland, Oregon

Session Index

Session D25: Focus Session: Dopants and Defects in Semiconductors - Nitrides, SiC

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