Bulletin of the American Physical Society
APS March Meeting 2010
Volume 55, Number 2
Monday–Friday, March 15–19, 2010; Portland, Oregon
Session B15: Focus Session: Advances in Scanned Probe Microscopy I: Novel AFM, MRFM, and Acoustic Microscopy
11:15 AM–2:15 PM,
Monday, March 15, 2010
Room: B114
Sponsoring
Unit:
GIMS
Chair: Robert McMichael, National Institute of Standards and Technology
Abstract ID: BAPS.2010.MAR.B15.2
Abstract: B15.00002 : Towards ultrasensitive scanning probe force detection with silicon nanowire mechanical resonators*
11:51 AM–12:03 PM
Preview Abstract Abstract
Authors:
John Nichol
(University of Illinois at Urbana-Champaign)
Eric Hemesath
(Northwestern University)
Lincoln Lauhon
(Northwestern University)
Raffi Budakian
(University of Illinois at Urbana-Champaign)
*This work was supported by the ARO (MURI grant W911NF-05-0414) and the DOE BES (grant DEFG02-07ER46453) at the University of Illinois and by the NSF (NIRT program) at Northwestern University.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.MAR.B15.2
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