Bulletin of the American Physical Society

APS March Meeting 2010

Volume 55, Number 2

Monday–Friday, March 15–19, 2010; Portland, Oregon

Session Index

Session B15: Focus Session: Advances in Scanned Probe Microscopy I: Novel AFM, MRFM, and Acoustic Microscopy	Show Abstracts
Sponsoring Units: GIMS Chair: Robert McMichael, National Institute of Standards and Technology Room: B114

Monday, March 15, 2010 11:15AM - 11:51AM		B15.00001: Probing bias-strain coupling on the nanoscale by Piezoresponse Force Microscopy: from ferroelectric and multiferroics to energy storage materials Invited Speaker: Preview Abstract
Monday, March 15, 2010 11:51AM - 12:03PM		B15.00002: Towards ultrasensitive scanning probe force detection with silicon nanowire mechanical resonators John Nichol, Eric Hemesath, Lincoln Lauhon, Raffi Budakian Preview Abstract
Monday, March 15, 2010 12:03PM - 12:15PM		B15.00003: Characterization of an MRFM probe in the SPAM geometry Doran Smith Preview Abstract
Monday, March 15, 2010 12:15PM - 12:27PM		B15.00004: High sensitivity electron spin magnetic resonance force microscopy for labeled biological samples Eric W. Moore, SangGap Lee, Steven A. Hickman, Sarah J. Wright, Lee E. Harrell, Jonilyn G. Longenecker, Peter P. Borbat, Jack H. Freed, John A. Marohn Preview Abstract
Monday, March 15, 2010 12:27PM - 12:39PM		B15.00005: Non-degenerate parametric amplification used for surface noise evasion in scanned probe microscopy SangGap Lee, Eric Moore, Steven Hickman, Lee Harrell, John Marohn Preview Abstract
Monday, March 15, 2010 12:39PM - 12:51PM		B15.00006: Whispering-Gallery Acoustic-Sensing of Shear-forces Rodolfo Fernandez Rodriguez, Xiaohua Wang, Mike Hopkins, Keith Parker, Richard Nordstrom, Andres La Rosa Preview Abstract
Monday, March 15, 2010 12:51PM - 1:03PM		B15.00007: The Ultrasonic-Coupled Near-Field Microscope Andres La Rosa, Rodolfo Fernandez, Xiohua Wang, Michael Hopkins, Keith Parker, Richard Nordstrom Preview Abstract
Monday, March 15, 2010 1:03PM - 1:15PM		B15.00008: AFM Study of Charge Transfer Between Metals Due to the Oxygen Redox Couple in Water Jeremy Trombley, Tessie Panthani, Mohan Sankaran, John Angus, Kathleen Kash Preview Abstract
Monday, March 15, 2010 1:15PM - 1:27PM		B15.00009: Towards Obtaining Ultimate Resolution with Atomic Force Microscopy Nikolaj Moll, Leo Gross, Fabian Mohn, Alessandro Curioni, Gerhard Meyer Preview Abstract
Monday, March 15, 2010 1:27PM - 1:39PM		B15.00010: Spatial Resolution of Electrical Measurements Performed with Scanning Probe Microscopes as a Function of Tip Shape Ilona Sitnitsky, Vincent LaBella, Joseph Kopanski Preview Abstract
Monday, March 15, 2010 1:39PM - 1:51PM		B15.00011: Micromolding fabrication of SiC SPM probes Chiayun Wu, Lian Dai, Carlos Hernandez, Daniel Schmidt, Joel Therrien Preview Abstract
Monday, March 15, 2010 1:51PM - 2:03PM		B15.00012: Atomic-scale Nanoprobes Fabricated by Localized Ion Flux Reduction and Field-Directed Sputter Sharpening Scott Schmucker, Joseph Lyding Preview Abstract
Monday, March 15, 2010 2:03PM - 2:15PM		B15.00013: Elastic property characterization of oxidized Si nanowires by contact-resonance atomic force microscopy Gheorghe Stan, Robert Cook Preview Abstract

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Bulletin of the American Physical Society

APS March Meeting 2010

Volume 55, Number 2

Monday–Friday, March 15–19, 2010; Portland, Oregon

Session Index

Session B15: Focus Session: Advances in Scanned Probe Microscopy I: Novel AFM, MRFM, and Acoustic Microscopy

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