Bulletin of the American Physical Society

2009 APS March Meeting

Volume 54, Number 1

Monday–Friday, March 16–20, 2009; Pittsburgh, Pennsylvania

Session Index

Session H27: Focus Session: Advances in Scanned Probe Microscopy II: Force Methods	Show Abstracts
Sponsoring Units: DCMP Chair: Young Kuk, Seoul National University Room: 329

Tuesday, March 17, 2009 8:00AM - 8:12AM		H27.00001: Temperature Dependence of Single-Asperity Friction for Diamond on Diamond and DLC Interfaces C. Dunckle, I.B. Altfeder, P. Taborek Preview Abstract
Tuesday, March 17, 2009 8:12AM - 8:24AM		H27.00002: Small amplitude vibrations of curved atomic force microscope cantilevers: Theory Arvind Narayanaswamy, Carlo Canetta, Ning Gu Preview Abstract
Tuesday, March 17, 2009 8:24AM - 8:36AM		H27.00003: Intermodulation Atomic Force Microscopy and Spectroscopy Carsten Hutter, Daniel Platz, Erik Tholen, David Haviland, Hans Hansson Preview Abstract
Tuesday, March 17, 2009 8:36AM - 8:48AM		H27.00004: Independent determination of depth and energy of electronic trap states in dielectric films by Dynamic Tunneling Force Microscopy Jon Paul Johnson, Clayton C. Williams Preview Abstract
Tuesday, March 17, 2009 8:48AM - 9:24AM		H27.00005: Applications of AFM for atomic manipulation and spectroscopy Invited Speaker: Preview Abstract
Tuesday, March 17, 2009 9:24AM - 9:36AM		H27.00006: Design of a variable temperature scanning force microscope E. Nazaretski, K. S. Graham, J. D. Thompson, J. K. Baldwin, J. A. Wright, D. V. Pelekhov, P. C. Hammel, R. Movshovich Preview Abstract
Tuesday, March 17, 2009 9:36AM - 9:48AM		H27.00007: Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids Jose R. Lozano, Elena T. Herruzo, Nicolas F. Martinez, Ricardo Garcia Preview Abstract
Tuesday, March 17, 2009 9:48AM - 10:00AM		H27.00008: High-Resolution Magnetic Resonance Force Microscopy using Iron Filled Carbon Nanotubes Michael Herman, Palash Banerjee, Kin Chung Fong, Denis Pelekhov, Franziska Wolny, Thomas Muhl, Bernd B\"uchner, Chris Hammel Preview Abstract
Tuesday, March 17, 2009 10:00AM - 10:12AM		H27.00009: Electron Spin Magnetic Resonance Force Microscopy of Nitroxide Spin Labels Eric W. Moore, SangGap Lee, Steven A. Hickman, Sarah J. Wright, John A. Marohn Preview Abstract
Tuesday, March 17, 2009 10:12AM - 10:24AM		H27.00010: A Compact, Wide Temperature Range (300mK-300K) Magnetic Force Microscope using High Resolution Fibre Interferometer and Alignment-Free Cantilevers Ozgur Karci, Munir Dede, Ahmet Oral Preview Abstract
Tuesday, March 17, 2009 10:24AM - 10:36AM		H27.00011: A novel method to measure 3 components of magnetic fields with submicron resolution using Scanning Hall Probe Microscopy/Gradiometry Ahmet Oral, Munir Dede, Rizwan Akram Preview Abstract
Tuesday, March 17, 2009 10:36AM - 10:48AM		H27.00012: Development of Superconducting Quantum Interference Device DC Magnetometer for High Magnetic Field and Dilution Refrigerator Applications J.-H. Park, T.P. Murphy, S.W. Tozer, E.C. Palm Preview Abstract

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Bulletin of the American Physical Society

2009 APS March Meeting

Volume 54, Number 1

Monday–Friday, March 16–20, 2009; Pittsburgh, Pennsylvania

Session Index

Session H27: Focus Session: Advances in Scanned Probe Microscopy II: Force Methods

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