Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session V36: Advances in Scanned Probe Microscopy IV: Optical and High Frequency Methods
11:15 AM–1:51 PM,
Thursday, March 13, 2008
Morial Convention Center
Room: 228
Sponsoring
Unit:
GIMS
Chair: Phillip First, Georgia Institute of Technology
Abstract ID: BAPS.2008.MAR.V36.1
Abstract: V36.00001 : High-resolution element-selective microscopy using X-ray enhanced Scanning Tunneling Microscopy*
11:15 AM–11:27 AM
Preview Abstract Abstract
Authors:
Volker Rose
(Argonne National Laboratory)
John Freeland
(Argonne National Laboratory)
Kenneth Gray
(Argonne National Laboratory)
Stephen Streiffer
(Argonne National Laboratory)
Matthias Bode
(Argonne National Laboratory)
*This work was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under contract DE-AC02-06CH11357. Corresponding author: vrose@anl.gov
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.V36.1
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