Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session V36: Advances in Scanned Probe Microscopy IV: Optical and High Frequency Methods	Show Abstracts
Sponsoring Units: GIMS Chair: Phillip First, Georgia Institute of Technology Room: Morial Convention Center 228

Thursday, March 13, 2008 11:15AM - 11:27AM		V36.00001: High-resolution element-selective microscopy using X-ray enhanced Scanning Tunneling Microscopy Volker Rose, John Freeland, Kenneth Gray, Stephen Streiffer, Matthias Bode Preview Abstract
Thursday, March 13, 2008 11:27AM - 11:39AM		V36.00002: Scanning optical homodyne detection of high-frequency picoscale resonances in cantilever and tuning fork sensors J. C. Randel, G. Zeltzer, A. K. Gupta, R. Bashir, S.-H. Song, H. C. Manoharan Preview Abstract
Thursday, March 13, 2008 11:39AM - 11:51AM		V36.00003: Radio Frequency Scanning Tunneling Microscopy: Instrumentation and Applications Utku Kemiktarak, Tchefor Ndukum, Keith C. Schwab, Kamil L. Ekinci Preview Abstract
Thursday, March 13, 2008 11:51AM - 12:03PM		V36.00004: Thermomechanical Noise Measurements of Very High Frequency (VHF) Nanomechanical Resonators Carl Hart IV, Kamil Ekinci Preview Abstract
Thursday, March 13, 2008 12:03PM - 12:15PM		V36.00005: Development of an Evanescent Microwave Probe / Scanning Tunneling Microscope to study Localized Electron Spin Resonance Christian Long, Naoyuki Taketoshi, Ichiro Takeuchi, Haitao Yang, Xiao-Dong Xiang Preview Abstract
Thursday, March 13, 2008 12:15PM - 12:27PM		V36.00006: High Frequency Piezoresponse Force Microscopy in the 1-10 MHz Regime Katyayani Seal, Stephen Jesse, Brian Rodriguez, Arthur Baddorf, Sergei Kalinin Preview Abstract
Thursday, March 13, 2008 12:27PM - 12:39PM		V36.00007: Contrast sensitive imaging with a cantilever-based near-field microwave probe Keji Lai, Worasom Kundhikanjana, Michael Kelly, Zhi-xun Shen Preview Abstract
Thursday, March 13, 2008 12:39PM - 12:51PM		V36.00008: STM and SNOM Type of Scanning Probe Microscopes in the Same Unit: Towards Electrical Modification and Optical Characterization at Nanoscale Ilya Sychugov, Hiroo Omi, Tooru Murashita, Yoshihiro Kobayashi Preview Abstract
Thursday, March 13, 2008 12:51PM - 1:03PM		V36.00009: A Unique Probe for Tip Enhanced Raman Scattering and Shadow NSOM Aaron Lewis, Hesham Taha, Rimma Dekhter, Galia Zinoviev, Galina Fish Preview Abstract
Thursday, March 13, 2008 1:03PM - 1:15PM		V36.00010: Chemical Imaging of the Surface of Polymeric Nanostructures Using Apertureless Near-Field IR Microscopy Zahra Fakhraai, Kerstin Mueller, Melissa Paulite, Xiujuan Yang, Gilbert C. Walker Preview Abstract
Thursday, March 13, 2008 1:15PM - 1:27PM		V36.00011: Scanning thermal microscopy with a fluorescent nanoprobe Benjamin Samson, Elika Saidi, Lionel Aigouy, Peter Low, Beomjoon Kim, Christian Bergaud, Michel Mortier Preview Abstract
Thursday, March 13, 2008 1:27PM - 1:39PM		V36.00012: A versatile technique for fabrication of SiC SPM probes Joel Therrien, Daniel Schmidt, Sheetal Barrot, Bhavin Patel Preview Abstract
Thursday, March 13, 2008 1:39PM - 1:51PM		V36.00013: \textit{In-situ} broadband microwave calibrations and measurements using cryogenic probe stations Jeffrey Lindemuth, Scott Yano Preview Abstract

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Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session V36: Advances in Scanned Probe Microscopy IV: Optical and High Frequency Methods

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