Bulletin of the American Physical Society
2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008; New Orleans, Louisiana
Session H36: Focus Session: Advances in Scanned Probe Microscopy II: Force Methods
8:00 AM–10:48 AM,
Tuesday, March 11, 2008
Morial Convention Center
Room: 228
Sponsoring
Unit:
GIMS
Chair: Andreas Heinrich, IBM
Abstract ID: BAPS.2008.MAR.H36.12
Abstract: H36.00012 : Micromechanical force detectors for measuring magnetization at high magnetic fields and the magnetic~ response of Ba3Cr2O8.
10:36 AM–10:48 AM
Preview Abstract Abstract
Authors:
K. Ninios
Y. J. Jo
L. Balicas
A. Aczel
G. M. Luke
H. B. Chan
Collaborations:
Dept of Physics, University of Florida, NHMFL, Tallahassee
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.H36.12
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