Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session H36: Focus Session: Advances in Scanned Probe Microscopy II: Force Methods	Show Abstracts
Sponsoring Units: GIMS Chair: Andreas Heinrich, IBM Room: Morial Convention Center 228

Tuesday, March 11, 2008 8:00AM - 8:36AM		H36.00001: Multi-dimensional Scanning Probe Microscopy Invited Speaker: Preview Abstract
Tuesday, March 11, 2008 8:36AM - 8:48AM		H36.00002: A Low Temperature Scanning Force Microscope with a Vertical Cantilever and Interferometric Detection Scheme Jeehoon Kim, T.L. Williams, Sang Lin Chu, Hasan Korre, Max Chalfin, J.E. Hoffman Preview Abstract
Tuesday, March 11, 2008 8:48AM - 9:00AM		H36.00003: New Interpretation of Non-contact Atomic Force Microscopy Images of Dihydride Si(001) Surface Based on Simulation Akira Masago, Satoshi Watanabe, Katsunori Tagami, Masaru Tsukada Preview Abstract
Tuesday, March 11, 2008 9:00AM - 9:12AM		H36.00004: Real-time detection and reduction of probe-loss in atomic force microscopy Pranav Agarwal, Tathagata De, Murti Salapaka Preview Abstract
Tuesday, March 11, 2008 9:12AM - 9:24AM		H36.00005: Evaluation of sensitivity and selectivity of piezoresistive cantilever-array sensors Genki Yoshikawa, Hans-Peter Lang, Urs Staufer, Peter Vettiger, Toshio Sakurai, Christoph Gerber Preview Abstract
Tuesday, March 11, 2008 9:24AM - 9:36AM		H36.00006: Observation of locally excited ferromagnetic resonance via magnetic resonance force microscopy Evgueni Nazaretski, Denis Pelekhov, Ivar Martin, Peter C. Hammel, Roman Movshovich Preview Abstract
Tuesday, March 11, 2008 9:36AM - 9:48AM		H36.00007: Characterization of the High Coercivity Magnetic Probe Tips for Magnetic Resonance Force Microscopy I.H. Lee, J. Kim, Yu Obukhov, P. Banerjee, D.V. Pelekhov, P.C. Hammel Preview Abstract
Tuesday, March 11, 2008 9:48AM - 10:00AM		H36.00008: Fabrication Challenges in Producing Magnet-tipped Cantilevers for Magnetic Resonance Force Microscopy Steven A. Hickman, Sean R. Garner, Lee E. Harrell, Jeremy C. Ong, Seppe Kuehn, John A. Marohn Preview Abstract
Tuesday, March 11, 2008 10:00AM - 10:12AM		H36.00009: Fabricating overhanging magnets for use in magnetic resonance force microscopy using a XeF2 isotropic etch. Sarah Wright, Steven Hickman, John Marohn Preview Abstract
Tuesday, March 11, 2008 10:12AM - 10:24AM		H36.00010: Bimodal AFM imaging of individual protein molecules with sub-pico Newton force sensitivity. Nicolas F. Martinez, Shiva Patil, Jose R. Lozano, Ricardo Garcia Preview Abstract
Tuesday, March 11, 2008 10:24AM - 10:36AM		H36.00011: Rheological Measurements by AFM of the Formation of Polymer Nanofibers Mehdi Yazdanpanah, Mahdi Hosseini, Santosh pabba, Scott Berry, Vladimir Dobrokhotov, Abdelilah Safir, Robert Keynton, Robert Cohn Preview Abstract
Tuesday, March 11, 2008 10:36AM - 10:48AM		H36.00012: Micromechanical force detectors for measuring magnetization at high magnetic fields and the magnetic~ response of Ba3Cr2O8. K. Ninios, Y. J. Jo, L. Balicas, A. Aczel, G. M. Luke, H. B. Chan Preview Abstract

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Bulletin of the American Physical Society

2008 APS March Meeting

Volume 53, Number 2

Monday–Friday, March 10–14, 2008; New Orleans, Louisiana

Session Index

Session H36: Focus Session: Advances in Scanned Probe Microscopy II: Force Methods

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