Bulletin of the American Physical Society
2006 APS March Meeting
Monday–Friday, March 13–17, 2006; Baltimore, MD
Session V46: Defects and Impurities in Si/Ge
11:15 AM–1:51 PM,
Thursday, March 16, 2006
Baltimore Convention Center
Room: 349
Sponsoring
Unit:
FIAP
Chair: Torgny Gustafsson, Rutgers University
Abstract ID: BAPS.2006.MAR.V46.5
Abstract: V46.00005 : Using Si(100) - 2 x 1:H as a Platform for Patterned Silicon Growth
12:03 PM–12:15 PM
Preview Abstract Abstract
Authors:
Matthew M. Sztelle
(Department of Electrical and Computer Engineering and Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois )
Scott W. Schmucker
(Department of Electrical and Computer Engineering and Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois )
Joseph W. Lyding
(Department of Electrical and Computer Engineering and Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.MAR.V46.5
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