2006 APS March Meeting
Monday–Friday, March 13–17, 2006;
Baltimore, MD
Session G17: Focus Session: Emerging Research Devices and Materials for Microelectronics Industry I
8:00 AM–10:48 AM,
Tuesday, March 14, 2006
Baltimore Convention Center
Room: 313
Sponsoring
Unit:
FIAP
Chair: Mike C. Garner, Intel Corporation
Abstract ID: BAPS.2006.MAR.G17.10
Abstract: G17.00010 : Resistive Switching of Individual Dislocations in Insulating Perovskites -- A Potential Route Towards Nanoscale Non-Volatile Memories.
10:12 AM–10:24 AM
Preview Abstract
Abstract
Authors:
Krzystof Szot
Wolfgang Speier
Gustav Bihlmayer
Rainer Waser
(CNI \& IFF, FZ Juelich)
Electrically controlled resistive switching effects have been
reported for a
broad variety of binary and multinary oxides in recent years. In
particular,
titanates, zirconates, and manganites have been in the focus of
the studies.
In many cases, the mechanism of the switching and the geometrical
extension
of the phenomenon (filaments vs. bulk) are still under
discussion. In this
work, we present evidence for a redox-based switching mechanism
and we
indicate a potential route towards highly scalable non-volatile
memories
based on this switching effect.
The challenge our work is to utilize resistive switching
mechanism with the
aim to construct \textit{active} electronic elements on a real
nanoscale level, here by
reversibly switching the electrical properties of individual
dislocations by
electrical stimuli. We demonstrate that standard undoped
SrTiO$_{3}$ single
crystals, utilized as a model system, exhibit a switching
behavior along
filaments based on dislocations, mediated by oxygen transport.
For this, we
employed a three-step procedure: the crystals were, at first,
annealed at
elevated temperatures under reducing conditions, then exposed to
200mbar
O$_{2}$ pressure at room temperature, and finally subjected to an
electric
field under ultrahigh vacuum (electroformation). This treatment
induced in a
metal-insulator (SrTiO$_{3})$-metal (MIM) system a transition to
metallic
state. A hysteretic behavior appears after dynamical polarization
of the MIM
structure at the maximum electroforming currents. The shape of
the I/V curve
has the typical signature for bi-stable switching known for these
types of
perovskites. The positive temperature dependence of the
resistance of the
low- (LRS) and the high-resistance (HRS) state clearly identifies
both
states to be metallic in character.
The inhomogeneity of the electrical transport becomes directly
evident from
a simple optical inspection and the conductivity maps as measured
by LC-AFM
of a planar structure. One can trace the formation of the filaments,
emerging from the cathode and propagating towards the anode
during the
electroformation process. These filaments are well-oriented along
the
$<$100$>$-axis of the crystal and show a discrete and granular
substructure
on the nano-scale. The similarity in lateral distribution of exit
points
(spots) of conducting nano-filaments with respect to the
distribution of
etch pits suggests that the electrical transport along dislocations
determines the micro- and meso-scopic electrical transport
phenomena. Our
results suggest that a dedicated contact arrangement is required
to handle
the filamentary conduction in a practical way by using macroscopic
electrodes. At the same time, it emphasizes the need to control
the relevant
processes on the level of individual dislocations. With LC-AFM it is
possible to specifically address single dislocations crossing the
surface
with adequate spatial resolution and use the conducting
cantilever as the
nano-electrode through galvanic point contact. We succeeded to
initiate the
local electroformation process for a single dislocation by
applying a dc
bias to the tip of the cantilever. Such nano-prepared
dislocations reveal
bi-stable switching behavior between a linear and a non-linear
$I/V$-characteristics. The dynamic range of the electrical
resistance covers at
least 3 to 4 orders of magnitude at read-out voltages of 0.1 V.
In order to develop a microscopic model for the filament, we
performed
first-principles calculations of extended, linear defects in
SrTiO$_{3}$.
Our analyse of electronic structure for extended defects with TiO
enrichment
establish that already subtle changes in O-content are sufficient to
modulate the electronic properties and provide the necessary
self-doping
capability with a reversible transition between non-metallic and
metallic
behaviour. We propose a model for the resistive switching in
SrTiO$_{3}$
based on the modulation of the electrical properties through
electrical
stimuli in a small segment of an orthogonal network of dislocations.
Switching in our case corresponds then to an electrochemical
``closing'' or
``opening'' of the single dislocation in the uppermost portion of
the
network.
Our results show that the switching behaviour in single-crystalline
SrTiO$_{3}$ is an inherent property of the material and can be
easily
activated by external stimuli. Due to the availability of
dislocation
densities up to 10$^{12}$ cm$^{-2}$ in single crystals and thin
film, one
can even envisage to approach the Tbit regime, as long as the
dislocations
can be successfully arranged into registered superstructures.
In summary, evidence is given that the electrical conductance of
individual
dislocations in a prototype perovskite, SrTiO$_{3}$, can be
switched between
a low and a high conducting state by the application of an
electrical field.
We demonstrate on the basis of \textit{ab initio} calculations
and measurements with a
scanning probe microscope SPM that the modulation of the electrical
properties is related to the induced change in oxygen
stoichiometry and the
self-doping capability with a local insulator- metal transition
along the
core of the dislocations. A model is presented based on a
three-dimensional
network of such a filamentary structure to analyze the bi-stable
resistive
switching in the macroscopic metal-insulator-metal (MIM)
structure. Our
results show that electrically addressing individual dislocations
in single
crystals as well as epitaxial thin films provides a dynamic range
for
switching between low and high conducting states which covers
several orders
of magnitude in resistance and can be of technological interest
for the
application in Tbit non-volatile memory devices..
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.MAR.G17.10