2006 APS March Meeting
Monday–Friday, March 13–17, 2006;
Baltimore, MD
Session B4: Advances in ZnO Materials Physics and Applications
11:15 AM–2:15 PM,
Monday, March 13, 2006
Baltimore Convention Center
Room: 308
Sponsoring
Units:
DMP FIAP
Chair: Tom Myers, West Virginia University
Abstract ID: BAPS.2006.MAR.B4.3
Abstract: B4.00003 : Localized States and Charge Transfer at ZnO Surfaces and Interfaces*
12:27 PM–1:03 PM
Preview Abstract
Abstract
Author:
Leonard Brillson
(The Ohio State University)
With the advent of techniques to probe semiconductor electronic
properties
in the near-interface region on a nanometer scale, it is now
possible to
understand and control the mechanisms playing a role in localized
state
formation and charge transfer at ZnO interfaces. While world-wide
research
activity into this major new semiconductor has increased
dramatically, the
ability to control ZnO interfaces has been a major challenge to
their opto-
and microelectronic applications. Nanoscale depth-resolved
cathodoluminescence and x-ray photoemission spectroscopies reveal
the
segregation of point defects and the donor character of hydrogen
in the
near-surface region. A conversion from ohmic to rectifying
behavior is
observed for gold contacts on atomically ordered polar ZnO surfaces
following remote oxygen plasma treatment. This transition is
accompanied by
reduction of the well-known ``green'' deep level emission,
suppression of
the hydrogen donor-bound exciton photoluminescence and a large
increase in
n-type band bending. These results demonstrate that the contact type
conversion involves more than one mechanism, specifically,
removal of the
adsorbate-induced accumulation layer plus lowered tunneling due
to reduction
of near-surface donor density and defect-assisted hopping transport.
Schottky barriers for a wide array of metals on ZnO reveal that
the strength
of interface reaction plays a dominant role in forming
near-interface
defects and the resultant Schottky barriers. Similar correlations
for other
compound semiconductors indicate that the impact of
near-interface native
defects on Schottky barriers is more general in nature.
\newline
\newline
[1] H.L. Mosbacker, Y.M. Strzhemechny, B.D. White, P.E. Smith,
D.C. Look,
D.C. Reynolds, C.W. Litton, and L.J. Brillson, ``Role of
Near-Surface States
in Ohmic-Schottky Conversion of Au Contacts to ZnO,'' Appl. Phys.
Lett. 87,
012102 (2005).
\newline
[2] Y.M. Strzhemechny, H.L. Mosbacker, D.C. Look, D.C. Reynolds,
C.W. Litton,
N.Y.Garces, NC. Giles, L.E. Halliburton, S. Niki, and L.J. Brillson,
``Remote Hydrogen Plasma Doping of Single Crystal ZnO,'' Appl.
Phys. Lett.
84, 2545 (2004).
*Supported by the National Science Foundation and the Office of Science, Department of Energy
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.MAR.B4.3