Bulletin of the American Physical Society
63rd Annual Gaseous Electronics Conference and 7th International Conference on Reactive Plasmas
Volume 55, Number 7
Monday–Friday, October 4–8, 2010; Paris, France
Session TF4: Plasma Diagnostics III: Reactive Plasmas
10:30 AM–12:30 PM,
Friday, October 8, 2010
Room: 151
Chair: Gilles Cunge, LTM-CNRS, Grenoble, France
Abstract ID: BAPS.2010.GEC.TF4.7
Abstract: TF4.00007 : A comprehensive GD-OES and GD-MS study to elucidate the effect of trace molecular gases (O$_{2}$, H$_{2}$, and N$_{2}$) on argon-based glow discharge plasmas
12:15 PM–12:30 PM
Preview Abstract Abstract
Authors:
S. Mushtaq
J.C. Pickering
E.B.M. Steers
P. Horvath
J.A. Whitby
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.GEC.TF4.7
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