Bulletin of the American Physical Society
85th Annual Meeting of the APS Southeastern Section
Volume 63, Number 19
Thursday–Saturday, November 8–10, 2018; Holiday Inn at World’s Fair Park, Knoxville, Tennessee
Session A01: Atomic, Molecular, and Optical Physics
8:30 AM–10:30 AM,
Thursday, November 8, 2018
Holiday Inn Knoxville Downtown
Room: Summit
Chair: John Yukich, Davidson College
Abstract ID: BAPS.2018.SES.A01.2
Abstract: A01.00002 : Towards quantum sensing with noble-gas-trapped thulium atoms
9:00 AM–9:30 AM
Presenter:
Colin V Parker
(Georgia Inst of Tech)
Authors:
Vinod Gaire
(Georgia Inst of Tech)
Chandra Raman
(Georgia Inst of Tech)
Colin V Parker
(Georgia Inst of Tech)
Motivated by the prospect of atomic-scale sensing, we investigate the properties of thulium atoms trapped in solid helium and argon matrices. Neutral thulium (Tm) is a lanthanide atom whose single-hole f-shell electronic structure is equivalent to that in the Yb3+ ion frequently used in solid-state optical applications. Existing spectroscopy in solid helium [1] suggests that Tm metastable lifetimes can remain long, and that the linewidth can become quite narrow on inner-shell f-f transitions. Potential placement of noble gas films on material or device surfaces would allow sensing of the local environment, and the relatively unperturbed nature of the transitions suggests a high degree of quantum control may be possible. If these attributes carry over to neon and argon hosts this would be desirable because solid helium exists only under pressure at very low temperatures. However, the nature of the perturbations (such as crystal field splitting) due to these noble gas hosts are unknown. As a first step towards understanding them we will present lifetime and coarse lineshape measurements of the 1140 nm line in both neon and argon hosts. In both cases lifetimes are tens of milliseconds. Spectroscopy shows most of the fluorescence signal within the 3 nm spectrometer resolution, with a possible weak satellite feature in argon.
[1] Ishikawa et al, PRB 56 780 (1997)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.SES.A01.2
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