Bulletin of the American Physical Society
2024 APS March Meeting
Monday–Friday, March 4–8, 2024; Minneapolis & Virtual
Session N30: Microwave and Optical Physics Applications in Telecommunications
11:30 AM–2:30 PM,
Wednesday, March 6, 2024
Room: 102AB
Sponsoring
Unit:
FIAP
Chair: Nathan Orloff, National Institute of Standards and Technology
Abstract: N30.00002 : Electro-Optic Millimeter-Wave Sources and Receivers for THz Electronics
12:06 PM–12:42 PM
Presenter:
Bryan Bosworth
(National Institute of Standards and Technology)
Authors:
Bryan Bosworth
(National Institute of Standards and Technology)
Nick Jungwirth
(National Institute of Standards and Technology)
Jerome Cheron
(National Institute of Standards and Technology)
Christian Long
(NIST)
Ari Feldman
(National Institute of Standards and Technology)
Nate Orloff
(National Institute of Standards and Technology)
To synthesize arbitrary waveforms, we generate an electro-optic frequency comb, apply fine amplitude and phase control to pairs of comb lines (beat notes), and demultiplex the beat notes to uni-traveling carrier photodiodes. We apply this to arbitrary waveform generation with 100 GHz of instantaneous bandwidth on a single photodiode. By connecting several photodiodes on-wafer to a frequency combiner covering DC to 1 THz, we will enable much greater amplitude and bandwidth.
To explore network analysis on-wafer, we demonstrate an electro-optic imaging system for measuring millimeter-wave propagation along a coplanar waveguide (CPW). A custom polarization-resolved microscope images small electro-optic effects due to millimeter-wave voltages between the signal and ground of the CPW. By sampling multiple positions along the CPW, the amplitude and phase of all tones (up to 500 GHz in the first experiment) at multiple mmWave reference planes can be measured simultaneously, revealing forward and backward traveling waves. Dual electro-optic frequency combs demonstrate time-domain waveform imaging on-wafer with >100 GHz of bandwidth. A second configuration demonstrates continuous wave electro-optic vector network analysis with 70 measurement planes on-wafer.
With electro-optic synthesis and network analysis, we will measure new electronics such as NIST’s ultrawideband comb generators and mixers, making use of instantaneous bandwidth and time-domain capabilities that cannot be achieved otherwise.
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