Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session S28: New Ways of Seeing with Electrons
11:15 AM–2:15 PM,
Thursday, March 5, 2020
Room: 405-407
Sponsoring
Unit:
FIAP
Chair: Todd Brintlinger, United States Naval Research Laboratory
Abstract: S28.00001 : Defining Theoretical Limits of Aberration-Corrected Electron Tomography: New Bounds for Resolution, Object Size, and Dose
Presenter:
Robert Hovden
(Materials Science and Engineering, University of Michigan)
Author:
Robert Hovden
(Materials Science and Engineering, University of Michigan)
Here we present a theoretical foundation for aberration-corrected electron tomography by establishing analytic descriptions for resolution, sampling, object size, and dose—with direct analogy to the Crowther criterion. The 3D structure of a contrast transfer function (CTF) for through focal tomography where every specimen tilt measures a toroid with petal-shaped cross-section. A remarkable feature of the 3D CTF is the overlapped regions that permit complete information collection—unachievable with conventional tomography. This breaks expected Crowther relationships and the maximum reconstructable object size is unlimited up to spatial frequency kc. At resolutions beyond 2/kc, Crowther-like tradeoffs define the maximum object size (D) allowed for given 3D resolution (d).
When the tilt angle spacing becomes smaller than twice the convergence angle (2α) a continuum of information is measured and object size is unbounded at midband resolution. This occurs under typical instrument operation (> 25 mrad) and sampling (< 2° tilt). We show atomic resolution (1Å) 3D imaging is allowed across extended objects (> 20 nm) using currently available microscopes and modest specimen tilting (< 3°).
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