Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session R65: Superlattices and Nanostructures I: Growth, Structure, and Electronic Properties
8:00 AM–10:00 AM,
Thursday, March 5, 2020
Room: Mile High Ballroom 4F
Sponsoring
Unit:
DCMP
Chair: Sangita Bhowmick, Shiv Nadar Univ
Abstract: R65.00008 : Classification of Critical Points in Energy Bands Based on Topology, Scaling and Symmetry
Presenter:
Noah Yuan
(Massachusetts Institute of Technology MIT)
Authors:
Noah Yuan
(Massachusetts Institute of Technology MIT)
Liang Fu
(Massachusetts Institute of Technology MIT)
the corresponding energy, the density of states (DOS) exhibits non-analyticity such as divergence.
Critical points can be rst classied as ordinary and high-order ones, and the ordinary critical
points have been studied thoroughly by Leon van Hove, whose DOS is particle-hole symmetric and
logarithmically divergent. In this work, we describe and classify high-order critical points based
on topology, scaling and symmetry. We show that high-order critical points can have power-law
divergent DOS with particle-hole asymmetry, and can be realized at generic or symmetric momenta
by tuning a few parameters such as twist angle, strain, pressure and/or external elds.
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