APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020;
Denver, Colorado
Session Index
Session R63: Defects: Structure and Strain 2
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Sponsoring Units: DMP DCMP FIAP
Chair: Rachel Goldman, Univ of Michigan - Ann Arbor
Room: Mile High Ballroom 4D
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R63.00001: Dynamic Dark-Field X-ray Microscopy to Probe Mesoscale Defects and their Dynamics
Invited Speaker:
Leora Dresselhaus-Cooper
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R63.00002: High-throughput identification of point defects in SiC
Joel Davidsson, Viktor Ivady, Rickard Armiento, Igor Abrikosov
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R63.00003: Theoretical Investigations of the Hyperfine Coupling in Group IV-Vacancy Centers in Diamond Using Hybrid Density Functional Theory
Rodrick Kuate Defo, Efthimios Kaxiras, Steven Richardson
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R63.00004: Theory on spectral diffusion and electrically driven interferometry of qubits
Péter Udvarhelyi, Gergo Thiering, Viktor Ivady, Adam Gali
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R63.00005: Progress for high photon collection of color centers in quantum materials
Tony Zhou, Preston Zhou, Gabriel Silverman, Kelechi Ukah, Ling Xie, Amir Yacoby
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R63.00006: Modeling the Electronic Structure of Phosphorus Donor Clusters in Quantum Devices
Quinn Campbell, Peter A Schultz, Mitchell I Brickson, Noah T Jacobson, Leon N Maurer, Ezra Bussmann, Shashank Misra, Andrew Baczewski
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R63.00007: Electron paramagnetic resonance study of sodium guests in silicon clathrates, a cage-like crystalline silicon allotrope
William Schenken, Yinan Liu, Lakshmi Krishna, Ahmad Afif Abdul Majid, Carolyn Koh, P Craig Taylor, Reuben T Collins
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R63.00008: Quadrupolar interactions between acceptor pairs in p-doped semiconductors
Adam Durst, Genesis Yang-Mejia, Ravindra Nautam Bhatt
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R63.00009: Nanoscale NV-detected Electron Spin Resonance at 115 GHz and 4.2 Tesla
Benjamin Fortman, Junior Pena, Susumu Takahashi
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R63.00010: Defects in 4H-SiC Studied by Electrically Detected Magnetic Resonance and Electrically Detected Electron Nuclear Resonance
Ryan Waskiewicz, Brian Manning, Duane McCrory, Patrick Lenahan
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R63.00011: Hybrid spintronics as a novel platform for quantum sensing.
Artur Lozovoi, Harishankar Jayakumar, Damon Daw, Carlos Meriles
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R63.00012: High-density defect ensembles in SiC for superradiance and magnetometry
Peter Brereton, Seth Rittenhouse, Joseph Wiedemann, Jeffrey R Vanhoy, John Abraham
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