APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020;
Denver, Colorado
Session Index
Session F33: Morphology Characterization: Resonant X-ray Scattering
Focus
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Sponsoring Units: DPOLY
Chair: Cheng Wang, Lawrence Berkeley National Laboratory
Room: 505
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F33.00001: BREAK
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F33.00002: Polymer Morphology Measurement by Polarized Resonant Soft X-ray Scattering
Invited Speaker:
Dean DeLongchamp
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F33.00003: 12-ID – Soft Matter Interfaces (SMI) – A new resonant tender x-rays scattering Beamline at NSLS II
Guillaume Freychet
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F33.00004: Molecular orientation in polyamide reverse osmosis membranes revealed by polarized resonant soft x-ray scattering
Peter Beaucage
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F33.00005: Label-free characterization of aqueous molecular micelle nanostructure and dynamics via in-situ RSoXS
Terry McAfee, Brian Akira Collins, Isvar Cordova, Cheng Wang, Thomas Ferron, Phillip Pickett
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F33.00006: Probing Buried Chemical Profiles in Novel EUV Resists with Energy-Tunable X-Rays
Isvar Cordova, Luke Long, Guillaume Freychet, Cheng Wang, Patrick Naulleau
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F33.00007: Revealing Strain-Induced Conjugated Polymer Behaviors with Soft X-Ray Scattering and Spectroscopy
Wenkai Zhong, Gregory Su, Qin Hu, Feng Liu, Wanli Yang, Thomas Russell, Cheng Wang
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F33.00008: Polarized resonant soft X-ray scattering reveals local chain orientation in polymer-grafted nanoparticles
Subhrangsu Mukherjee, Jason Streit, Richard Arthur Vaia, Dean DeLongchamp
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F33.00009: Combining spectroscopy with DFT for optical models of polarized RSoXS to reveal molecular alignment in nanostructures
Victor Murcia, Brian Akira Collins
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F33.00010: Control of solvent aggregation to impact active layer morphology and enhance performance in non-fullerene organic solar cells
Guoyan Zhang, Sintu Rongpipi, Brooke Kuei, Enrique D Gomez
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F33.00011: Controlling Ionomer Phase Separation Through Side-Chain Engineering
Gregory Su, Isvar Cordova, William White, Matthew Lindell, Michael Yandrasits, Lawrence Renna, Jun Feng, Shane Ardo, Cheng Wang, Ahmet Kusoglu
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