Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session Index
Session F10: Advances in Scanned Probe Microscopy 3: Scanning Probes Spectroscopic TechniquesFocus Session
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Show Abstracts |
Sponsoring Units: GIMS Chair: Stephen Jesse, University of Tennessee Room: 108 |
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F10.00001: Direct and converse flexoelectricity: the effect of strain and electric field gradients on nanoscale electromechanical responses Invited Speaker: Neus Domingo | |
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F10.00002: New modalities for cryogenic nano-imaging and -spectroscopy Sven A. Doenges, Kyoung-Duck Park, tao jiang, Fabian Menges, Markus B. Raschke | |
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F10.00003: Bulk ferromagnetic tips for spin-polarized scanning tunneling microscopy Masahiro Haze, Hung-Hsiang Yang, Kanta Asakawa, Ryosuke Yamamoto, Nobuyuki Watanabe, Yasuo Yoshida, Yukio Hasegawa | |
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F10.00004: Fourier transform infrared scanning tunneling microscopy: Measuring vibrational modes at the nanoscale Kristopher Barr, Naihao Chiang, Andrew Ira Guttentag, Paul S Weiss | |
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F10.00005: Role of steps on Pb atomic-layer superconductivity Yudai Sato, Fumikazu Oguro, Kanta Asakawa, Takashi Uchihashi, Yukio Hasegawa | |
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F10.00006: GHz-THz near-field imaging of extreme subwavelength metal structures Xinzhong Chen, Xiao Liu, Xiangdong Guo, Shu Chen, Hai Hu, Elizaveta Nikulina, Ziheng Yao, Hans Bechtel, Michael Martin, G Carr, Qing Dai, Songlin Zhuang, Qing Hu, Yiming Zhu, Rainer Hillenbrand, Mengkun Liu, Guanjun You | |
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F10.00007: Ultrafast infrared nano-spectroscopic imaging of heterogeneous photoinduced dynamical processes Jun Nishida, Samuel C. Johnson, Sven A. Doenges, Amani H Alfaifi, Sean Shaheen, Markus B. Raschke | |
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F10.00008: Calibrating atomic force microscope detectors on soft surfaces Daniel Forchheimer, Daniel Platz, Riccardo Borgani, David Haviland | |
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F10.00009: The influence of time and temperature on viscoelastic properties of nanoscale domains within polymer composites Bede Pittenger, Sergey Osechinskiy, John Thornton, Sophie Loire, Thomas Mueller | |
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F10.00010: Cryogenic Scattering-type Scanning Near-field Optical Microscopy Fanwei Liu, Xi Chen, Mengkun Liu, Hanqing Mao, Sidan Chen, Xinzhong Chen, Ziheng Yao |
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