Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session A64: High Mobility, Wide Bandgap Oxides for Electronics
8:00 AM–11:00 AM,
Monday, March 2, 2020
Room: Mile High Ballroom 4E
Sponsoring
Unit:
DMP
Chair: Turan Birol, University of Minnesota
Abstract: A64.00012 : Epitaxial Oxides on Glass: A Platform for Integrated Oxide Devices*
Presenter:
Agham Posadas
(University of Texas at Austin)
Authors:
John E Ortmann
(University of Texas at Austin)
Martha R. McCartney
(Arizona State University)
Agham Posadas
(University of Texas at Austin)
David John Smith
(Arizona State University)
Alexander Demkov
(University of Texas at Austin)
where the crystalline device silicon layer of SOI has been replaced by a crystalline functional TMO layer. Fabrication starts with ultra-thin body SOI on which crystalline STO is grown epitaxially by molecular beam epitaxy. The device silicon layer is subsequently fully oxidized by
ex situ high-temperature dry O2 annealing, as confirmed by X-ray photoelectron spectroscopy, X-ray reflectivity, and high-resolution electron microscopy. STO maintains its epitaxial registry to the carrier silicon substrate after annealing and no evidence for degradation of the STO
crystalline quality as a result of the TMO-on-glass fabrication process is observed. The ease of fabricating the TMO-on-glass platform without the need for wafer bonding will enable rapid progress in the development of state-of-the-art TMO-based electronic and photonic devices.
*The work at UT Austin was supported by the Air Force Office of Scientific Research under Grant No. FA9550-18-1-0053.
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