Bulletin of the American Physical Society
APS March Meeting 2019
Volume 64, Number 2
Monday–Friday, March 4–8, 2019; Boston, Massachusetts
Session X12: Devices from 2D Materials -- Advanced Fabrication
8:00 AM–10:48 AM,
Friday, March 8, 2019
BCEC
Room: 153A
Sponsoring
Unit:
DMP
Chair: Cui-Zu Chang, Pennsylvania State University
Abstract: X12.00010 : Maximizing Alloy Graphene Interface Conductance
10:12 AM–10:24 AM
Presenter:
Dipanjan Saha
(Mechanical Engineering, Carnegie Mellon University)
Authors:
Dipanjan Saha
(Mechanical Engineering, Carnegie Mellon University)
Xiaoxiao Yu
(Chemical Engineering, Carnegie Mellon University)
Zhitao Guo
(Chemical Engineering, Carnegie Mellon University)
Nicholas Golio
(Chemical Engineering, Carnegie Mellon University)
Mohamed Darwish
(Electrical Engineering, Carnegie Mellon University)
Yunus Kesim
(Electrical Engineering, Carnegie Mellon University)
Jeffrey Weldon
(Electrical Engineering, Carnegie Mellon University)
Andrew Gellman
(Chemical Engineering, Carnegie Mellon University)
Jonathan A Malen
(Mechanical Engineering, Carnegie Mellon University)
To make high throughput measurements, metal films with a continuous alloy composition gradient spanning two pure metals were deposited on monolayer graphene on SiO2/Si substrates. Frequency domain thermoreflectance was used to measure thermal interface conductance as a function of metal composition. Future measurements of electrical contact resistance will be done through transmission line measurement structures, in order to determine the optimal alloy concentration for both electrical and thermal transport across the interface.
[1] P. E. Hopkins, M. Baraket, E. V. Barnat, T. E. Beechem, S. P. Kearney, J. C. Duda, J. T. Robinson, and S. G. Walton, Nano Lett. 12, 590 (2012).
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